1. Demonstration of atomic force microscopy imaging using an integrated opto-electro-mechanical transducer
- Author
-
Frank W. M. van Otten, Maurangelo Petruzzella, Abbas Mohtashami, Federico Galeotti, Andrea Fiore, Rob W. van der Heijden, Hamed Sadeghian Marnani, Gustav Lindgren, Semiconductor Nanophotonics, Photonics and Semiconductor Nanophysics, NanoLab@TU/e, Group Lopez Arteaga, Dynamics and Control, and EAISI Health
- Subjects
Materials science ,business.industry ,Integrated displacement sensor ,Photodetector ,Physics::Optics ,Waveguide (optics) ,Atomic and Molecular Physics, and Optics ,Displacement (vector) ,Electronic, Optical and Magnetic Materials ,Metrology ,Opto-electro-mechanics ,Transducer ,Miniaturization ,Optoelectronics ,Photonic crystal ,AFM ,business ,Instrumentation ,Throughput (business) - Abstract
The low throughput of atomic force microscopy (AFM) is the main drawback in its large-scale deployment in industrial metrology. A promising solution would be based on the parallelization of the scanning probe system, allowing acquisition of the image by an array of probes operating simultaneously. A key step for reaching this goal relies on the miniaturization and integration of the sensing mechanism. Here, we demonstrate AFM imaging employing an on-chip displacement sensor, based on a photonic crystal cavity, combined with an integrated photodetector and coupled to an on-chip waveguide. This fully-integrated sensor allows high-sensitivity and high-resolution in a very small footprint and its readout is compatible with current commercial AFM systems.
- Published
- 2021
- Full Text
- View/download PDF