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We have investigated intraband absorptions in GaN/AlN QDs for ultrafast all-optical switching applications at telecommunication wavelengths. Using time-resolved pump-probe experiments the electron lifetime in the excited state of the QDs is measured to be 165 fs. Intraband absorption saturation experiments reveal a record low switching energy. We then investigate quantum cascade ISB photodetectors based on GaN/AlGaN QWs and show that mesa devices with 17 × 17 μm 2 size provide a frequency response above 10 GHz at 1.5 μm wavelength.

Various structures of self-assembled Ge/Si quantum dot infrared photodetectors were implemented and investigated. The electronic structure of the QDIPs was studied by electrical and optical techniques including I–V characteristics, dark current, photoconductivity, photoluminescence, and photo-induced infrared absorption. The photoconductive spectra consist of a broad multi-peak, composed of peaks ranging from 70 to 220 meV. Their relative intensity changes with bias. Comparative dark current measurements were performed. Dark current limits the performance of this first generation of Ge/Si QDIPs. It is plausible that direct doping in the dot layer is a viable way of reducing the dark current. � 2003 Elsevier B.V. All rights reserved.

The transport properties of channel delta-doped quantum well structures were characterized by conventional Hall effect and light-modulated Shubnikov-de Haas (SdH) effect measurements. The large number of carriers that become available due to the delta-doping of the channel, leads to an apparent degeneracy in the well. As a result of this degeneracy, the carrier mobility remains constant as a function of temperature from 300 K down to 1.4 K. The large amount of impurity scattering, associated with the overlap of the charge carriers and the dopants, resulted in low carrier mobilities and restricted the observation of the oscillatory magneto-resistance used to characterize the two-dimensional electron gas (2DEG) by conventional SdH measurements. By light-modulating the carriers, we were able to observe the SdH oscillation at low magnetic fields, below 1.4 tesla, and derive a value for the quantum scattering time. Our results for the ratio of the transport and quantum scattering times are lower than those previously measured for similar structures using much higher magnetic fields.

Excess carrier distribution and saturation current generated by a graded p‐n junction are investigated, approximating the dopant profile by an exponential function. Analytical solutions of the steady‐state continuity equation are presented for lifetime dominated by Auger, radiative, or Shockley–Read recombination mechanisms, for both ohmic and electrically reflecting boundary conditions. The saturation current generated by the graded region is derived for each of the dominant mechanisms and boundary conditions. Unlike previous published works the result of this analysis is a set of concise analytical expressions that make them a useful tool for simulation and investigation of graded structures such as silicon solar cells. The results are calculated for HgCdTe diodes, demonstrating the effect of the profile slope as determined by surface and bulk concentrations and junction depth. It is shown that the contribution of the graded region to the saturation current, as compared to that of the substrate, is sign...

The contribution of the graded region of implanted p-n junctions is analyzed using an exponential profile. Though previously neglected, it was recently shown that this contribution to the saturation current of HgCdTe diodes is significant. Assuming a dominant Auger recombination, an analytical solution to the continuity equation is obtained. An expression for the current generation by the graded region is presented for both ohmic and reflecting boundary conditions. A revised condition for a wide region is derived. When the region is narrow, the current differs drastically from that of the zero-gradient case. The effects of the junction depth and the substrate and surface concentrations on the current are investigated. It is shown that the reverse current does not saturate.

Comparative analysis of photoconductive (PC) spectra obtained from SiGe quantum dots grown on Si shows large dependence on the location of doping. The sample with doping in the silicon barrier has much larger response than the sample in which the doping was placed in the wetting layer, i.e. in the self assembled dots. This is due to the penetration of the wave-function into the barrier in the first structure, as shown by the 1-D simulation. Several peaks in the infrared were observed, ranging from 70 to 220 meV, associated with inter-level transitions of holes in the valance band of the dot or the wetting layer. The overall spectra and the relative intensity of the various peaks change drastically with bias magnitude and polarity. The PC signals increase super-linearly with bias, indicating that the carriers are released into the quasi-continuum through tunneling.

A high detectivity multiquantum well midinfrared photodetector is reported. It is based on a strain compensated InGaAs/InGaP on InP structure, using bound-to-continuum intersubband absorption, with λP=4.9 μm and ∼0.5 μm full width at half maximum. This design is unique by enabling a large critical thickness, thus increasing the quantum efficiency. Photodetectors with background-limited performance (BLIP) with detectivity of Dλ*(BLIP)=3.2×1010 cmHz/W up to 110 K, with only ten quantum well periods were implemented. Arguments are given to predict an optimized background-limited performance for this design up to 135 K.

The contribution of more than one carrier to the conductivity in modulation‐doped field effect transistors (MODFET) affects the resultant mobility and complicates the characterization of these devices. Mixed conduction arises from the population of several subbands in the two‐dimensional electron gas (2DEG), as well as the presence of a parallel path outside the 2DEG. We characterized GaAs/AlGaAs MODFET structures with both delta and continuous doping in the barrier. Based on simultaneous Hall and conductivity analysis we conclude that the parallel conduction is taking place in the AlGaAs barrier, as indicated by the carrier freezeout and activation energy. Thus, simple Hall analysis of these structures may lead to erroneous conclusions, particularly for real‐life device structures. The distribution of the 2D electrons between the various confined subbands depends on the doping profile. While for a continuously doped barrier the Shubnikov–de Haas analysis shows superposition of two frequencies for concent...

The observation of intersubband (e1–e2) absorption induced by current injection in GaAs/GaAlAs multiquantum wells is reported. The new technique enables sensitive measurement of intersubband transitions in undoped quantum wells. The carrier concentration in the wells is easily controlled by varying the current density. The technique is demonstrated on undoped multiquantum well layers sandwiched in a p‐i‐n laser‐diodelike structure. The lowest confined level was populated by biasing the junction and hence injecting carriers into the quantum wells. The spectra were taken by a Fourier transform infrared (FTIR) spectrometer, modulating the current and using the double modulation method. The dependence of the absorption on current intensity was examined and excess carrier concentration and lifetime were calculated. The induced absorption saturates at current densities higher than 100 mA/cm2.

A technique for determination of room-temperature two-dimensional electron gas (2DEG) concentration and mobility in heterostructures is presented. Using simultaneous fits of the longitudinal and transverse voltages as a function of applied magnetic field, we were able to separate the parameters associated with the 2DEG from those of the parallel layer. Comparison with the Shubnikov-de Haas data derived from measurements at liquid helium temperatures proves that the analysis of the room-temperature data provides an excellent estimate of the 2DEG concentration. In addition we were able to obtain for the first time the room-temperature mobility of the 2DEG, an important parameter to device application. Both results are significantly different from those derived from conventional Hall analysis.

A drastic enhancement of the Shubnikov–de Haas (SdH) pattern is obtained by recording the changes in the quantum oscillations of magnetoresistance due to modulation of the carrier concentration. The technique enables measurement of the SdH waveform at relatively high temperatures and in samples with moderate mobilities. The modulated waveform shows selective enhancement of the low‐frequency SdH oscillations associated with the upper subband. Thus, we were able to record very clear oscillations generated by a carrier concentration well below 5×1010 cm−2. The theory for this selective enhancement is provided.

In a graded junction, the formalism for handling reflecting boundary conditions must be modified. Since a significant drift term is present, zero recombination velocity at the surface does not imply a zero excess carrier gradient but rather zero overall flux. A model for analyzing p‐n junctions fabricated by implantation or diffusion is presented, assuming the dominant recombination mechanism in the graded region is Auger. The model enables optimization of diode design. By proper selection of parameters, mainly by reducing surface concentration or by increasing the steepness of the dopant profile, it is possible to drastically reduce the saturation current generated by the graded region.

Heat treatment at 70 °C of low carrier concentration p‐type HgCdTe samples (p0=8×1014 cm−3) generates an inverted surface layer. A two day anneal process below 95 °C did not affect the Hall coefficient, whereas an almost complete recovery was obtained by annealing at 120 °C. While bulk electron mobility, obtained from PEM data, remained high (about 9×104 cm2/V s at 77 K), surface mobility is lower by more than an order of magnitude. Surface recombination velocity indicates a continuous improvement with increased temperature, and the activation energy remains equal to the vacancies energy level. The proposed mechanism is that of positive charges in the sulfide migrating towards the interface and generating an image inversion layer.

3 páginas, 3 figuras.-- PACS: 85.60.Gz, 85.35.Be, Thermal generation rate in quantum dots (QD) can be significantly smaller than in quantum wells, rendering a much improved signal to noise ratio. QDs infrared photodetectors were implemented, composed of ten layers of self-assembled InAs dots grown on GaAs substrate. Low temperature spectral response shows two peaks at low bias, and three at a high one, polarized differently. The electronic level structure is determined, based on polarization, bias, and temperature dependence of the transitions. Although absorbance was not observed, a photoconductive signal was recorded. This may be attributed to a large photoconductive gain due to a relatively long lifetime, which indicates, in turn, a reduced generation rate., This research was partially supported by the Israeli Ministry of Science and Technology. Two of the authors (P.P. and J.G.) received financial support from QUEST, an NSF Science and Technology Center (DMR 11-20007)

Transport properties of a pseudomorphic In .20Ga.80As/Al.23Ga.77As HEMT structure have been measured by Hall and SdH techniques. Two samples of identical structures but different doping levels were compared. Low temperature mobility measurements as a function of concentration shows a sharp peak at a Hall concentration of 1.9.1012/cm2. This concentration coincides with the onset of second subband occupancy, indicating that the decrease in mobility is due to intersubband scattering. In spite of the low Al content (23%) large PPC was observed in the highly doped sample only, showing a direct correlation between the PPC and doping concentration of the barrier layer.

The issue of thermal imaging systems exposed to large photon fluxes is of great practical importance, as it is encountered while observing a scenery which includes ‘‘hot’’ sources. High illumination level phenomena appear when excess carrier density is comparable or larger than majority carrier density in the bulk. This state can be reached quite easily in n‐type HgCdTe detectors due to the moderate doping levels (typically ≤1015 cm−3). A modified expression for the current responsivity is derived, suitable for use at both high and low illumination levels. The quasineutrality assumption is verified; thus the ambipolar equation can be applied to describe high illumination behavior. Photoconductive detectors with and without covered electrodes are measured and analyzed. It is shown that under high illumination levels (1) the dominating recombination mechanism is the phonon assisted Auger process, and (2) the relative photoresponse for a covered electrode structure decreases monotonously with increasing cove...

Various surface passivations of p-type Hg1-xCdxTe were studied to understand their interface properties and and their potential for device technology. Anodic oxide forms an inverted layer near the interface. This n-type skin layer exhibits extremely good n-type properties, which equal, and even surpass, bulk properties. The high electron mobility may be explained by quantization of the electron levels in the space-charge region, and the formation of a two dimensional electron gas near the interface. Thick (approx 500 A) anodic sulfide generates a similar inversion layer. The charge density is proportional to the sulfide thickness. Carefully prepared thin (approx 100 A) anodic sulfide films as well as ZnS coating on freshly etched sur-faces, form nearly Hatband conditions which are suitable for n+ on p diode technology. The surface recombination velocity, determined for these two passivations using the photoelectromagnetic effect, is shown to be similar at low temperatures, increasing with decreasing temperatures. The dominant trapping mechanism at the surface is similar to that in the bulk, and is probably mostly due to vacancies.

A new technique for deriving the electron mobility as minority carriers in semiconductor materials is introduced. The technique is based on the modulation of the Hall voltage through the introduction of a low‐level optical injection. The photogenerated excess carriers produce a signal which is a function of the magnetic field, the carrier mobilities and concentrations, and the concentration of excess carriers and thus to their lifetime. The measurement is easy to implement and it can be performed along with the measurement of the Hall coefficient and the conductivity. The only modification needed in a conventional galvanomagnetic setup is the introduction of a chopped low‐intensity laser. Using these three simultaneous measurements, we determined the equilibrium carrier concentrations, the two mobilities, and the effective excess carrier lifetime of p‐type HgCdTe narrow gap semiconductor. This novel technique allows us to present the mobility of electrons as minority‐carrier throughout the temperature range of 13.6–300.2 K in this material.

The lifetime and carrier‐concentration profile of Hg1−xCdxTe photodiodes (x=0.2–0.3) formed by implantation of B+ ions (100 keV, 1013–1014 cm−2) into a p‐type substrate was investigated. Using graded C‐V measurements, concentration of carriers around the n+p junction was obtained. It was found that the junction is located at a depth of 0.7–1.5 μm, depending on the bulk hole concentration. The technique enables profiling of the same sample after annealing. The annealing process was shown to make the electron concentration shallower and thus to bring the junction closer to the surface. Various techniques were used to measure excess carrier lifetimes. All indicate that the extent of degradation of the excess electron lifetime in the p region is very limited. For all tested samples, an etch of 2 μm was enough to recover the bulk lifetime. These results contradict the general assumption of deep damages in the p‐type substrate. Thus, the contribution of the n+ side to the saturation current and to the R0A produ...

The optical absorption edges of Hg0.71Cd0.29Te and CdTe were measured over the temperature range 80≤T≤300 K. The refractive indices of these materials are determined over a large energy range at T=300 K and their dispersion relation is given. The absorption band tail of Hg1−xCdxTe has an exponential shape. Its slope increases with decreasing temperature. It is suggested that this tail is not caused by permanent lattice disorder but is a material property. An empirical expression for the absorption coefficient as a function of temperature and composition is derived. Using this expression, the zero‐intercept cut‐on energy of the infrared transmission spectrum at room temperature is used to define the composition for any desired thickness of Hg1−xCdxTe sample.

The distribution of excess carriers in the three dimensions of a semiconductor in closely packed sensing arrays is analytically derived using a novel three‐dimensional simulation. In addition to the introduction of lateral transport, the results show significant deviation from the distribution obtained out of the one‐dimensional model, both in magnitude and gradients. Thus, the net flow of carriers is drastically different than previously predicted. The technical implications of the exact three‐dimensional distribution on quantum efficiency and crosstalk is visualized. The effects of physical parameters such as absorption coefficient,diffusion length, array geometry, and detector structure are thoroughly investigated.

The recombination mechanisms in HgCdTe are analyzed. Detailed expressions for the radiative lifetime are presented, taking into account recent measurements of the absorption coefficient. In p‐type material, carrier freezeout is shown to increase the lifetime exponentially for the radiative and the Auger processes at low temperatures. The effect of background flux is introduced, taking into account its variation with temperature due to the change in energy gap. Lifetime measurements on p‐type samples are in good agreement with combined Auger 7 and radiative mechanisms, where the Auger process is more effective for low x values. Highly compensated materials are dominated by the Shockley–Read recombination. For all samples, the intrinsic region is controlled entirely by the Auger process.

The surface recombination velocity s has been determined for Hg1−xCdxTe (x∼0.2) for two different surface passivations: (i) anodic sulfide with an overcoating of ZnS and (ii) ZnS coating on freshly etched samples. The method used was photoelectromagnetic effect, in which a magnetic field is applied perpendicular to the diffusion current of optically generated injected carriers. Analysis of the magnetic field dependence of the resulting current can yield s, as well as carrier mobility, lifetime, etc. The temperature dependence of s is very similar for the two passivations at temperatures higher than 50 K, and is increasing with decreasing temperature. At low temperatures s continues to rise for ZnS passivation and stays flat for the native anodic sulfide. Two activation energies are determined: 12.5±1.5 meV at temperatures higher than 60 K, and 2.3±0.2 meV at temperatures lower than 30 K. The high‐temperature activation energy is identical for both passivations. It is concluded that the same surface traps control the surface recombination rate for the two passivations, and their concentration is equal in both cases. The traps are apparently ‘‘intrinsic,’’ and can be related to lattice defects, most probably vacancies. Their concentration at the surface is similar to that in the bulk.

A new method for measuring the ambipolar mobility is described. It is based on the determination of the travel time of excess carriers between two probes. Maintaining the device under a constant voltage, the travel time is depicted as the separation between two zeros on the output trace. Using this technique the ambipolar mobility of electrons in p‐type Hg 0.71Cd0.29Te was measured for the temperature range of 78–256 K.

A novel interface to InSb based on photochemical native oxide (PNOX), which improves conventional ultraviolet (UV) enhanced deposition, is reported. Prior to the deposition of SiO2, an additional stage of growing a native oxide by exposing the semiconductor to N2O and Hg vapors at low pressure under UV illumination is introduced. Composition and electrical properties of the interface are discussed. Compositional analysis was performed by Auger electron spectroscopy. Electrical properties were characterized using metal‐insulator semiconductor (MIS) capacitors and photodiodes implemented with UV enhanced chemical vapor deposition (CVD) oxide/PNOX/InSb. Interface state densities of 2–4×1011 cm−2 eV−1 are obtained with good uniformity and stability. The hysteresis of the MIS structure with 1000 A photoinduced CVD oxide on PNOX is very small, about 0.32 V for a ±20 V span measured at 77 K.

The validity of the assumption that the contribution of the n region to the current of Hg1-xCdxTe diodes is negligible was examined. By placing such diodes in a magnetic field we were able to separate between the current component originating in the p -type substrate, and that from the graded n region. Experimental results show that the ratio between these currents is 0.5 - 3, depending on temperature. The theoretical analysis reveals the influence of the electric field present outside the depletion region on the current generated by the graded region. This field not only produces a drift component, which drives the minority carriers into the junction, it also greatly modifies the excess carrier distribution, thereby changing diffusion part of the current. The analysis shows the importance of the lifetime profile in the graded region, which is a function of the specific recombination mechanism and its dependence on the local dopant concentration. The effect of parameters such as substrate concentration, surface concentration, and junction depth on this current is discussed.