1. Increased localization precision by interference fringe analysis
- Author
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Carl G. Ebeling, Jordan M. Gerton, Amihai Meiri, Rajesh Menon, Jason Martineau, and Zeev Zalevsky
- Subjects
Photon ,Light ,Gaussian ,Phase (waves) ,Interference (wave propagation) ,Sensitivity and Specificity ,Signal ,Article ,symbols.namesake ,Optics ,Path length ,Scattering, Radiation ,General Materials Science ,Physics ,business.industry ,Reproducibility of Results ,Equipment Design ,Function (mathematics) ,Image Enhancement ,Equipment Failure Analysis ,Refractometry ,Interferometry ,symbols ,Nanoparticles ,business - Abstract
We report a novel optical single-emitter-localization methodology that uses the phase induced by path length differences in a Mach-Zehnder interferometer to improve localization precision. Using information theory, we demonstrate that the localization capability of a modified Fourier domain signal generated by photon interference enables a more precise localization compared to a standard Gaussian intensity distribution of the corresponding point spread function. The calculations were verified by numerical simulations and an exemplary experiment, where the centers of metal nanoparticles were localized to a precision of 3 nm.
- Published
- 2015
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