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Interferometric Localization Microscopy

Authors :
Zeev Zalevsky
Erik M. Jorgensen
Carl G. Ebeling
Rajesh Menon
Amihai Meiri
Jordan M. Gerton
Source :
Imaging and Applied Optics 2014.
Publication Year :
2014
Publisher :
OSA, 2014.

Abstract

Interference of signal in Fourier space, emitted from single probes, is used to localize it by recording and computing the phase of the fringes. Such system has applications in super resolution localization microscopy.

Details

Database :
OpenAIRE
Journal :
Imaging and Applied Optics 2014
Accession number :
edsair.doi...........1062a8ab1289f96963f4ce31f4dd4521
Full Text :
https://doi.org/10.1364/dh.2014.jth1c.6