Improvement in in-plane localization precision of nanoparticles using interference analysis

Authors :: Amihai Meiri
Zeev Zalevsky
Carl G. Ebeling
Jason Martineau
Jordan M. Gerton
Rajesh Menon
Source :: Scopus-Elsevier
Abstract: We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

Subjects :: Point spread function
Materials science
Photon
business.industry
Gaussian
Nanoparticle
Interference (wave propagation)
symbols.namesake
Optics
Microscopy
symbols
business
Image resolution
Common emitter

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