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Interface recombination is one of the factors limiting the performance of Cu(In,Ga)Se_2 (CIGS). Especially in the absence of band grading at the front and rear surface, interface passivation approaches become important to improve device performance. The integration of an oxide layer as passivation layer at the front surface of the CIGS requires meticulous considerations in order not to impact the further steps of the solar cell production. In this article, a novel approach is reported to try to tackle the problem of interface recombination at the front surface of CIGS without affecting further solar cell production steps. In this approach, an Al_2O_3/HfO_2 multi-stack layer with contact openings is applied. NaCl template patterning with preliminarily selected parameters was used to create a homogeneous pattern of contact opening on the CIGS surface and allow the current flow in the device. After the removal of the NaCl islands, the holes in the multi-stack (openings) were visualized by scanning electron microscopy. In addition, energy-dispersive X-ray spectroscopy (EDS) was performed before and after chemical bath deposition of the buffer layer. The EDS result confirmed that the undesired etching of the Al_2O_3 layer during buffer layer deposition was prevented by using a thin HfO_2 layer. Solar cells were produced by using preliminarily selected parameters for the multi-stack design. As a result, without having a significant negative impact on the solar cell parameters, a device design was achieved which is almost comparable with the reference device. In addition, options for future improvement and development are discussed. European Union's H2020 Research and Innovation Program [715027]

Relatively fast achievements in the kesterite solar cell technology have been made over the last decade, but the experimental efficiency is still ∼13%. One proposed reason is an inappropriate band alignment with Cu2ZnSnS4 (CZTS) and CdS that results in strong interface recombination losses. Results of this work show that the temperature and duration of air annealing of the CZTS/CdS heterojunction are essential for device performance. Soft annealing slightly improved the device efficiency due to the elemental intermixing at the interface. On the other hand, extended annealing increased absorber band gap energy, resulting in higher VOC values, indicating the improved Cu–Zn ordering in the CZTS structure, which also could be expected to have a beneficial influence on the device performance. However, interface analysis revealed that the CZTS absorber surface layer was Cu-rich, providing the reason for the reduction in CZTS solar cell performance. The effect of annealing on the interface defects was analyzed by the capacitance–frequency–voltage (C–V–f) analysis combined with SCAPS simulations. C–V–f-based loss maps showed that air annealing modifies the density distribution of asymmetrical interface states at the CZTS/CdS interface, which becomes fully symmetrical for longer annealing times at 200 °C.

Current state-of-the-art Cu2ZnSn(S,Se)(4) kesterite solar cells are limited by low open-circuit voltages (V-OC). In order to evaluate to what extent the substitution of Sn by Ge is able to result in higher V oc values, this article focuses on Cu2ZnGeSe4 "CZGSe" devices. To reveal their full potential, different strategies are explored that, in particular, aim at the optimization of the CZGSe/buffer heterojunction. Here, employing hard X-ray photoelectron spectroscopy, it is evidenced that only a combination of different surface treatments is able to remove all detrimental secondary phases. Further improvements are achieved by establishing a solar cell heat treatment in air. A systematic study of the impact of different annealing temperatures and durations determines the best heat treatment parameters to be 60 min at 200 degrees C. Also, Zn(O,S,OH) as a more transparent alternative to the heavy-metal compound CdS buffer layer has been realized. Combining all of the strategies, solar cells with 8.5 and 7.5% total area efficiency have been prepared, which is a record for Sn-free kesterite solar cells and any kesterite solar cell with a Zn(O,S,OH) buffer, respectively. Beyond these records, this work clearly confirms the emerging trend that Ge-for-Sn substitution is a successful strategy to improve the V-OC of kesterite solar cells. This project has received funding from the European Union's Horizon 2020 Research and Innovation Program under grant agreement no. 640868. Choubrac, L (corresponding author), Univ Nantes, UMR6502, CNRS, Inst Mat Jean Rouxel IMN, F-44300 Nantes, France; Helmholtz Zentrum Berlin Mat & Energie GmbH, Dept Struct & Dynam Energy Mat, D-14109 Berlin, Germany. leo.choubrac@helmholtz-berlin.de

Ultrathin Cu(In,Ga)Se-2 (CIGS) absorber layers of 550 nm were grown on Ag/AlOx stacks. The addition of the stack resulted in solar cells with improved fill factor, open circuit voltage and short circuit current density. The efficiency was increased from 7% to almost 12%. Photoluminescence (PL) and time resolved PL were improved, which was attributed to the passivating properties of AlOx. A current increase of almost 2 mA/cm(2) was measured, due to increased light scattering and surface roughness. With time of flight-secondary ion mass spectroscopy, the elemental profiles were measured. It was found that the Ag is incorporated through the whole CIGS layer. Secondary electron microscopic images of the Mo back revealed residuals of the Ag/AlOx stack, which was confirmed by energy dispersive X-ray spectroscopy measurements. It is assumed to induce the increased surface roughness and scattering properties. At the front, large stains are visible for the cells with the Ag/AlOx back contact. An ammonia sulfide etching step was therefore applied on the bare absorber improving the efficiency further to 11.7%. It shows the potential of utilizing an Ag/AlOx stack at the back to improve both electrical and optical properties of ultrathin CIGS solar cells. This research was funded by European Union H2020 research and innovation program grant number 715027.

A new multi-stack approach with contact openings was investigated for front surface of Cu(In,Ga)Se 2 thin film solar cells. In this multi-stack design, a thin HfO x layer was used to protect a thicker AlO x layer from the presence of ammonia in the chemical bath deposition. The contact openings were created by using alkali solution. The lifetime decay was improved by implementing multi-stack passivation layer between CIGS/buffer layer interface. It was shown that open circuit voltage was increased by up to 30mV.

In this contribution, a cost- and time- effective contacting approach is presented for dielectric-based rear surface passivation layers up to 30 nm. Nano-size and homogenously distributed openings are realized in AlOx passivation layer by selenization of LiF salt on top, and monitored via SEM. Further, this layer was implemented into sub-micron thick CIGS solar cells. Consequently, contact openings facilitate the current collection through the dielectric layer up to 30 nm thick. However, solar cell parameters remain the same, even worse than the reference. Thus, this approach is still open for optimizations.

Cu2ZnGeSe4 (CZGSe) is a promising earth-abundant and non-toxic semiconductor material for large-scale thin-film solar cell applications. Herein, we have employed a joint computational and experimental approach to characterize and assess the structural, optoelectronic, and heterojunction band offset and alignment properties of a CZGSe solar absorber. The CZGSe films were successfully prepared using DC-sputtering and e-beam evaporation systems and confirmed by XRD and Raman spectroscopy analyses. The CZGSe films exhibit a bandgap of 1.35 eV, as estimated from electrochemical cyclic voltammetry (CV) measurements and validated by first-principles density functional theory (DFT) calculations, which predicts a bandgap of 1.38 eV. A fabricated device based on the CZGSe as a light absorber and CdS as a buffer layer yields power conversion efficiency (PCE) of 4.4% with V-OC of 0.69 V, FF of 37.15, and J(sc) of 17.12 mA cm(-2). Therefore, we suggest that interface and band offset engineering represent promising approaches to improve the performance of CZGSe devices by predicting a type-II staggered band alignment with a small conduction band offset of 0.18 eV at the CZGSe/CdS interface. SRR and NYD acknowledge the UK Engineering and Physical Sciences Research Council (EPSRC) for funding (Grant No. EP/S001395/1). This work has also used the Advanced Research Computing computational facilities at Cardiff (ARCCA) Division, Cardiff University, and HPC Wales. This work also made use of ARCHER facilities (http://www.archer.ac.uk), the UK's national supercomputing service via the membership of the UK's HEC Materials Chemistry Consortium, which is funded by EPSRC (EP/L000202). YAJ is thankful to Savitribai Phule Pune University Post Doctorate Fellowship (SPPU-PDF) program (Grant No. SPPU PDF/ST/CH/2019/0004) and School of Energy Studies for financial support and laboratory facilities. DGB, GB, and BV acknowledge the European Union's Horizon 2020 Research and Innovation Program (Grant agreement No. 640868). SRR and BV acknowledge UHasselt-BOF for the mobility grant project R-8751 (https://www.uhasselt.be/UH/Research-groups/en-projecten_DOC/en-project_details.html?pid=16044&t=en). Rondiya, SR; Dzade, NY (corresponding author), Cardiff Univ, Sch Chem, Main Bldg,Pk Pl, Cardiff CF10 3AT, S Glam, Wales. Vermang, B (corresponding author), Hasselt Univ Partner Solliance, Inst Mat Res IMO, Wetenschapspk 1, B-3590 Diepenbeek, Belgium ; Imec Div IMOMEC Partner Solliance, Wetenschapspk 1, B-3590 Diepenbeek, Belgium ; EneryVille, Thorpk,Poort Genk 8310 & 8320, B-3600 Genk, Belgium. rondiyas@cardiff.ac.uk; dzadeny@cardiff.ac.uk; bart.vermang@uhasselt.be

In this work, hafnium oxide layer is investigated as rear surface passivation layer for ultra-thin (550 nm) CIGS solar cells. Point contact openings in the passivation layer are realized by spin-coating potassium fluoride prior to absorber layer growth. Contacts are formed during absorber layer growth and visualized with scanning electron microscopy (SEM). To assess the passivating qualities, HfOx was applied in a metal-insulator-semiconductor (MIS) structure, and it demonstrates a low interface trap density in combination with a negative density of charges. Since we used ultra-thin devices that are ideal to probe improvements at the rear, solar cell results indicated improvements in all cell parameters by the addition of 2 nm thick HfOx passivation layer with contact openings.

We review the stability and reliability results of kesterite (Cu2ZnSn(S,Se)4, CZTSSe)-based solar cells and we complete the reviewed data with additional as yet unpublished data on these matters. We also review published and new data on upscaling and the possible technological applications for this material. Kesterite material is composed of mainly earth-abundant elements and is therefore very attractive for large-scale applications. Stability data are so far quite scarce and the main results are the accelerated aging tests carried out for CZTSSe monograin technology, as well as yet unpublished data on long indoor and outdoor irradiance tests carried out on thin-film CZTSSe technology deposited by a wet processing method. On upscaling and technological applications we point out the works on three main large-scale photovoltaic technologies (monograin, in-line vacuum thin film, and wet-deposited thin film), as well as some work on water-splitting applications. IMRA Europe and crystalsol thank their numerous co-workers for contributing to this work. The work carried out at cyrstalsol was partly supported by the European Union through the European Regional Development Fund and Archimedes/DoRa project TK141. IMRA Europe, Midsummer and Ayesa acknowledge the European Commision for the funding of the kesterite research from 2017 by the H2020 program under the project STARCELL (H2020-NMBP-03-2016-720907).

Wide band gap thin-film kesterite solar cell based on non-toxic and earth-abundant materials might be a suitable candidate as a top cell for tandem configuration in combination with crystalline silicon as a bottom solar cell. For this purpose and based on parameters we have extracted from electrical and optical characterization techniques of Cu2ZnGeSe4 absorbers and solar cells, a model has been developed to describe the kesterite top cell efficiency limitations and to investigate the different possible configurations with transparent back contact for fourterminal tandem solar cell application. Furthermore, we have studied the tandem solar cell performance in view of the band gap and the transparency of the kesterite top cell and back contact engineering. Our detailed analysis shows that a kesterite top cell with efficiency > 14%, a band gap in the range of 1.5-1.7 eV and transparency above 80% at the sub-band gaps photons energies are required to achieve a tandem cell with higher efficiency than with a single silicon solar cell. The authors would like to acknowledge the SWInG project financed by the European Union's Horizon 2020 research and innovation programme under grant agreement No 640868 and the Research Foundation Flanders-Hercules Foundation (FWO-Vlaanderen, project No AUGE/13/16:FT-IMAGER). Khelifi, S (corresponding author), Univ Ghent, Dept Solid State Sci, Krijgslaan S1, B-9000 Ghent, Belgium. samira.khelifi@ugent.be

Several optoelectronic issues, such as poor optical absorption and recombination, limit the power conversion efficiency of ultrathin Cu(In,Ga)Se-2 (CIGS) solar cells. To mitigate recombination losses, two combined strategies were implemented: a potassium fluoride (KF) post-deposition treatment (PDT) and a rear interface passivation strategy based on an aluminum oxide (Al2O3) point contact structure. The simultaneous implementation of both strategies is reported for the first time on ultrathin CIGS devices. Electrical measurements and 1D simulations demonstrate that in specific conditions, devices with only KF-PDT may outperform rear interface passivation based devices. By combining KF-PDT and rear interface passivation, an enhancement in an open-circuit voltage of 178 mV is reached over devices that have a rear passivation only, and of 85 mV over devices with only a KF-PDT process. Time-Resolved Photoluminescence measurements showed the beneficial effects of combining KF-PDT and the rear interface passivation at decreasing recombination losses in the studied devices, enhancing charge carrier lifetime. X-ray photoelectron spectroscopy measurements indicate the presence of an In and Se-rich layer that we linked to be a KInSe2 layer. Our results suggest that when bulk and front interface recombination values are very high, they dominate, and individual passivation strategies work poorly. Hence, this work shows that for ultrathin devices, passivation mitigation strategies need to be implemented in tandem. Funding Fundaca̧ o para a Cie ̃ ncia e Tecnologia through grants IF/ ̂00133/2015, PD/BD/142780/2018, and SFRH/BD/146776/2019 and projects PDTC/CTM-CTM/28075/2017, PTDC/FISMAC/29696/2017, and UIDB/04730/2020 is acknowledged. European Union’s Horizon 2020 through grant nos. 720887 and 715027 and the Special Research Fund (BOF) of Hasselt University are also acknowledged. ACKNOWLEDGMENTS Fundaca̧ o para a Cie ̃ ncia e a Tecnologia (FCT) is acknowledged through the project IF/00133/2015, PD/BD/142780/2018, and SFRH/BD/146776/2019. The authors want to acknowledge the European Union’s Horizon 2020 research and innovation program under the agreement nos. 720887 (ARCIGS-M project) and 715027. The Special Research Fund (BOF) of Hasselt University, the FCT through the project NovaCell (PDTC/CTM-CTM/28075/2017), and InovSolarCells (PTDC/FISMAC/29696/2017) co-funded by FCT and the ERD through COMPETE2020 is also acknowledged. P. A. Fernandes would like to acknowledge FCT for the support of the project FCT UIDB/04730/2020.

In this work, first principle calculations of Cu$_2$ZnSnS$_4$ (CZTS), Cu$_2$ZnGeS$_4$ (CZGS) and Cu$_2$ZnSiS$_4$ (CZSS) are performed to highlight the impact of the cationic substitution on the structural, electronic and optical properties of kesterite compounds. Direct bandgaps are reported with values of 1.32, 1.89 and 3.06 eV respectively for CZTS, CZGS and CZSS. In addition, absorption coefficient values of the order of $10^4$ cm$^{-1}$ are obtained, indicating the applicability of these materials as absorber layer for solar cell applications. In the second part of this study, ab initio results are used as input data to model the electrical power conversion efficiency of kesterite-based solar cell. In that perspective, we used an improved version of the Shockley-Queisser theoretical model including non-radiative recombination via an external parameter defined as the internal quantum efficiency. Based on predicted optimal absorber layer thicknesses, the variation of the solar cell maximal efficiency is studied as a function of the non-radiative recombination rate. Maximal efficiencies of 25.88, 19.94 and 3.11% are reported respectively for CZTS, CZGS and CZSS for vanishing non-radiative recombination rate. Using an internal quantum efficiency providing $V_{OC}$ values comparable to experimental measurements, solar cell efficiencies of 15.88, 14.98 and 2.66% are reported respectively for CZTS, CZGS and CZSS (for an optimal thickness of 1.15 $\mu$m). With this methodology, we confirm the suitability of CZTS in single junction solar cells, with a possible efficiency improvement of 10% enabled through the reduction of the non-radiative recombination rate. In addition, CZGS appears to be an interesting candidate as top cell absorber layer for tandem approaches whereas CZSS might be interesting for transparent PV windows., Comment: 11 pages, 6 figures and 3 tables

This work reports on developments in the field of wide band gap Cu2ZnXY4 (with X = Sn, Si or Ge, and Y = S, Se) kesterite thin film solar cells. An overview on recent developments and the current understanding of wide band gap kesterite absorber layers, alternative buffer layers, and suitable transparent back contacts is presented. Cu2ZnGe(S,Se)(4) absorbers with absorber band gaps up to 1.7 eV have been successfully developed and integrated into solar cells. Combining a CdS buffer layer prepared by an optimized chemical bath deposition process with a 1.36 eV band gap absorber resulted in a record Cu2ZnGeSe4 cell efficiency of 7.6%, while the highest open-circuit voltage of 730 mV could be obtained for a 1.54 eV band gap absorber and a Zn(O,S) buffer layer. Employing InZnOx or TiO2 protective top layers on SnO2:In transparent back contacts yields 85-90% of the solar cell performance of reference cells (with Mo back contact). These advances show the potential as well as the challenges of wide band gap kesterites for future applications in high-efficiency and low-cost tandem photovoltaic devices. This project has received funding from the European Union's Horizon 2020 Research and Innovation Program under grant agreement No. 640868. The synchrotron radiation experiments were performed at the SPring-8 beamline BL15XU with the approval of the NIMS Synchrotron X-ray Station (Proposals 2016A4600, 2016B4601, and 2017A4600) and at BESSY II with the approval of HZB. B. Vermang has received funding from the European Research Council (ERC) under the European Union's Horizon 2020 Research and Innovation Programme (grant agreement no. 715027).

Interface quality plays a key role in solar cell applications. Interface recombination at the front and rear surfaces, which determine this quality, have significant effects on open circuit voltage and fill factor values. In this work, several surface treatments were applied on Cu(In,Ga)Se2 (CIGS) surfaces to improve the interface quality. Besides, the passivation layer implementation was investigated to reduce interface recombination between the buffer and absorber layers.

Reducing the absorber layer thickness below 1 μm for a regular copperindiumgalliumdi-selenide (CIGS)solar celllowers the minimum quality requirements for the absorber layer due to shorter electron diffusion length. Additionally, it reduces material costs and production time. Yet, having such a thin absorber reduces the cell efficiency significantly. This is due to incompletelight absorptionand high Molybdenum/CIGS rear-surface recombination [1]. The aim of this research is to implement some innovative rearsurface modificationson a 430 nm thick CIGS absorber layer to reduce both these affects: analuminium oxidepassivationlayer to reduce the back-surface recombination and point contact openings usingnano-particlesfor electrical contact. The impact of the implementation of all these rear-surface modifications on the opto-electrical properties of the CIGS solar cell will be discussed and analyzed in this paper.

This paper aims to demonstrate the importance of a cash flow generating standard for individual financial contract level data and the ability to create such a standard.,The authors analyze the importance for such a standard of software that turns natural language contracts into cash flow generating algorithms; a data dictionary that standardizes contract terms; and access to variables that represent the state of the world (e.g. market risk, counterparty risk, etc.) that affect contractual obligations.,The ability to realize benefits from the use of such a contract level algorithmic standard depends on the following: making the standard’s software open source; fully testing the software to have complete confidence in its accuracy; and enabling the software to use of a wide range of models of various sources of risk (market, credit and behavior risk) to support forward-looking analysis. Such a standard would solve the disconnect that exists in financial firms between the representation of financial contracts for transaction processing and analysis. The ACTUS Financial Research Foundation is building, testing and making available such a standard that represents almost all financial contracts extant in markets.,The adoption of such a standard would reduce the costs of operations of financial firms, provide the computational infrastructure for more effective regulatory oversight, reduce regulatory reporting costs and improve financial market transparency. It would also enable the assessment of systemic risk by directly quantifying the interconnectedness of firms.,This is a new approach to financial analytics that clearly separates the deterministic components of finance, which can be standardized from the stochastic elements that cannot be standardized.

The fabrication and properties of a Ge-based Kesterite Cu 2 ZnGeSe 4 (CZGSe) solar cell are discussed. The existence of the quaternary compound has been verified by physical methods such as X Ray Diffraction (XRD) and Energy Dispersive Spectroscopy (EDS). The Cu 2 ZnGeSe 4 solar cell has a power conversion efficiency (PCE) of 5.5% under AM1.5G illumination which is among the highest reported for pure Ge substitution. Detailed low temperature current-voltage and time-resolved photoluminescence measurements show that the Cu 2 ZnGeSe 4 absorber has less bulk defects and less band tailing in contrast to the typical characteristics of Cu 2 ZnSnSe 4 devices. These beneficial opto-electronic properties also resulted in a high open circuit voltage (V oc ) of 744 mV which is amongst the highest values reported for Kesterite materials.

In this work, an industrially viable and novel rear surface passivation approach for Copper Indium Gallium di-Selenide, Cu(In,Ga)Se2, CIGS, ultra-thin (500nm) solar cells is developed. The passivation layer was deposited by atomic layer deposition (ALD), and an alkali treatment was applied via spin coating. It was observed that selenization of the samples is required to create contact openings. The openings were visualized by SEM, and these results were supported by EDS. The impact of the oxide layer’s thickness, as well as the alkali solution’s molarity, was studied. Solar cells were produced for the optimal combination of these two parameters. As a result, with a relative 13% increase, the highest Vocof 623mV was achieved. Hence, the efficiency of the passivated solar cell was relatively increased by one-third, by using an industrially feasible, fast, and repeatable technique.

Producing the green energy of tomorrow will require highly efficient as well as energy --, and cost eff ective solar cells in addition to having reasonable lifetimes To determine if CIGS can be made to submit to these constraints , we produced ultrathin (500nm ) single stage coevaporated CIGS solar cells . We doped these cells with varying amounts and t ypes of a lkali atoms a nd submitted them to accelerated lifetime testing Results showed definite effect of the a lkali concen tration on the degradation of the cells b ut showed limited mig ration. Inste ad, the seeping of water into the gra in bounda rie s was identified as the main culprit for perf ormance degradati on. This work received funding from the European Union’s H2020 research and innovation program under grant agreement No. 715027

Nick Szabo defined smart contracts as, “….a set of promises, specified in digital form, including protocols within which the parties perform on the other promises.” The essence of a smart contract is that it is self-executing and has a protocol to effect this, i.e. the mechanism for communicating with the smart contract. In addition, Szabo distilled four basic objectives of any contract that should be fulfilled by smart contracts. Two of these, verifiability and enforceability, are given more attention in this paper. Szabo, however, did not address what types of contracts would be most suited to be executed as smart contracts. This paper describes first the unique aspects of financial contracts that make them the most promising candidates for implementation as smart contracts. Secondly, we analyze the conditions under which the use of distributed ledgers and smart financial contracts are most likely to prove successful. This analysis concludes that unless a distributed ledger is combined with an algorithmic financial contract standard and a standard protocol, the potential benefits of smart contracts will not be realized. The corollary to this conclusion is that it is essential for FinTech to adopt such a standard in order to be able to realize its promise of a paradigm shift in finance. The combination of distributed ledger technology and an open, well documented and well tested algorithmic financial contract standard is the next logical step in the development of FinTech.

The goal of this study was to analyse the frequency of ultrasonographic findings in 129 calves with bronchopneumonia and to determine how often multiple abnormalities occur in individual calves. The frequency of abnormal ultrasonographic findings ranged from 4 to 88%. Comet-tail artifacts were the most common finding (88%) followed in decreasing order by scattered echogenic foci (69%), air bronchograms (44%), superficial alveolograms (29%), pleural effusion (26%), hepatisation (23%), pleural lesions (18%), fluid bronchograms (14%), lung abscesses (6%) and fibrin deposits or fibrin strands (4%). Thoracic ultrasonography yielded a mean of 3.3 ± 1.55 abnormal findings (range, 1-6) per calf. Ultrasonography of the lungs in calves with bronchopneumonia is a useful adjunct to clinical examination and allows the determination of the type and severity of lesions.In der vorliegenden Arbeit wurde die Häufigkeit der bei 129 Kälbern mit Bronchopneumonie erhobenen Ultraschallbefunde retrospektiv ausgewertet. Ebenso wurde untersucht, wie oft bei einem Kalb mehrere Befunde gleichzeitig vorhanden waren. Die Häufigkeit abnormer Ultraschallbefunde variierte zwischen 4 und 88%. Kometenschweifartefakte stellten mit 88% den häufigsten abnormen Befund dar. Sie wurden in abnehmender Reihenfolge gefolgt von Luftreflexen (69%), Luftbronchogrammen (44%), oberflächlichen Alveologrammen (29%), Pleuraergüssen (26%), Hepatisation (23%), Pleuraveränderungen (18%), Flüssigkeitsbronchogrammen (14%), Lungenabszessen (6%) und Fibrin oder Fibrinspangen (4%). Im Durchschnitt wurden pro Kalb 3.3 ± 1.55 krankhafte Ultraschallbefunde ermittelt. Die ­Ultraschalluntersuchung der Lunge stellt bei Kälbern mit Bronchopneumonie eine wertvolle Ergänzung der klinischen Untersuchung dar. Sie ermöglicht es, die Art und den Schweregrad der bronchopneumonischen Veränderungen darzustellen und zu objektivieren.Dans la présente étude, la fréquence des constatations échographiques anormales recueillies sur 129 veaux souffrant de bronchopneumonie a été évaluée de manière rétrospective. Il a également été étudié combien de fois un veau présentait simultanément plusieurs découvertes. La fréquence des échographies anormales variait entre 4 et 88%. Des artefacts en queue de comète représentaient, avec 88%, les découvertes anormales les plus courantes. Ils étaient, par ordre décroissant, suivi par des réflexions de l’air (69%), des bronchogrammes aériens (44%), des alvéologrammes superficiels (29%), un épanchement pleural (26%), une hépatisation (23%), des altérations pleurales (18%), des bronchogrammes liquidiens (14%), des abcès pulmonaires (6%) et de la fibrine ou des ponts de fibrine (4%). En moyenne 3,3 ± 1,55 résultats d’échographie anormaux ont été déterminés par veau. L’examen échographique des poumons est, chez les veaux souffrant d’une bronchopneumonie, un complément précieux à l’examen clinique. Il permet de représenter la nature et la gravité des changements de bronchopneumonie et de les objectiver.In questo studio si è valutata retrospettivamente la frequenza dei risultati ecografici di 129 vitelli affetti da broncopolmonite e si è esaminato quanto spesso erano presenti contemporaneamente risultati anomali per lo stesso vitello. La frequenza dei risultati ecografici anomali si riscontrava tra il 4 e l’88%. Gli artefatti ecografici a “coda di cometa” erano nell’88% dei casi i risultati anomali più comuni. In ordine decrescente seguivano ecogenicità dell’aria (69%), broncogramma aereo (44%), alveogramma superficiale (29%), versamento pleurico (26%), epatizzazione (23%), lesioni pleuriche (18%), broncogrammi liquidi (14%), ascessi polmonari (6%) e fibrina o maglie di fibrina (4%). In media sono stati riscontrati 3.3 ± 1.55 esami ecografici anomali per ogni vitello. L’esame ecografico dei polmoni dei vitelli affetti da broncopolmonite è un valido esame complementare all’esame clinico e permette di determinare e ­evidenziare il tipo e la gravità delle lesioni broncopolmonari.

Cu2ZnSi(S,Se)4 and Cu2Si(S,Se)3 are potential materials to obtain cost effective high band gap absorbers for tandem thin film solar cell devices. A method to synthesize Cu2SiS3, Cu2SiSe3and Cu2ZnSiSe4thin film absorbers is proposed. This method is based on a multistep process, using sequential deposition and annealing processes. X-ray diffraction analysis performed on the final thin films have confirmed the presence of the Cu2Si(S,Se)3 and Cu2ZnSiSe4phases. Scanning electron microscopy images revealed the formation of polycrystalline layers with grains size up to 1 µm. The band gap of the ternary Cu2SiSe3 and Cu2SiS3, and quaternary Cu2ZnSiSe4 based thin films as determined from optical and photoluminescence measurements are found to be close to their theoretical values. (© 2015 WILEY-VCH Verlag GmbH &Co. KGaA, Weinheim)

We report on the electrical, optical and physical properties of Cu2ZnSnSe4 solar cells using an absorber layer fabricated by selenization of sputtered Cu, Zn and Cu10Sn90 multilayers. A maximum active-area conversion efficiency of 10.4% under AM1.5G was measured with a maximum short circuit current density of 39.7 mA/cm(2), an open circuit voltage of 394 mV and a fill factor of 66.4%. We perform electrical and optical characterization using photoluminescence spectroscopy, external quantum efficiency, current-voltage and admittance versus temperature measurements in order to derive information about possible causes for the low open circuit voltage values observed. The main defects derived from these measurements are strong potential fluctuations in the absorber layer as well as a potential barrier of the order of 133 meV at the back side contact. (C) 2014 Elsevier B.V. All rights reserved.

Cu2nSnSe4 (CZTSe) thin film solar cells are promising emergent photovoltaic technologies based on low-bandgap absorber layer with high absorption coefficient. To reduce optical losses in such devices and thus improve their efficiency, numerical simulations of CZTSe solar cells optical characteristics can be performed based on individual optical properties of each layer present in the cell structure. In this contribution, we have first determined the optical coefficients of individual thin films (i.e., (n, k) of the absorber, buffer, and window layers) to build a realistic model simulating the optical behavior of the whole cell stack we propose. Optical characterization was performed using two approaches, one based on ellipsometry measurements for characterizing thin flat cadmium sulfide (CdS) and zinc oxide (ZnO) layers and the other relying on reflectance and transmission (R/T) analysis for the rough CZTSe absorber. Then, we performed numerical simulations using as input experimental optical parameters predicting optimal CZTSe cell structure minimizing optical losses. The impact of each layer's thickness on the cell's short-circuit current has been studied. A set of optimal thicknesses of each of the active layers was proposed. Finally, the proposed optical optimization was experimented practically leading to CZTSe cells with 9.7% and 10.4% efficiencies. cop. 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

In this paper, we examine photoluminescence spectra (PL) of Cu2ZnSnSe4/CdS/ZnO solar cells, based on an absorber layer fabricated by selenization of sputtered Cu, Zn, Sn multilayers, via temperaturedependent and illumination power-dependent measurements. We observe anomalous emission behavior: the PL peak initially decreases with increasing temperature (red shift) in the temperature range 10– 60 K, followed by a blue shift at higher temperature in the range 60–180 K. A recombination model is proposed that is able to explain both temperature dependent PL as well as power-dependent PL. The important aspect of the proposed model is taking into account the presence of strong potential

We have investigated different nonidealities in Cu2ZnSnSe4–CdS–ZnO solar cells with 9.7% conversion efficiency, in order to determine what is limiting the efficiency of these devices. Several nonidealities could be observed. A barrier of about 300 meV is present for electron flow at the absorber–buffer heterojunction leading to a strong crossover behavior between dark and illuminated current–voltage curves. In addition, a barrier of about 130 meV is present at the Mo–absorber contact, which could be reduced to 15 meV by inclusion of a TiN interlayer. Admittance spectroscopy results on the devices with the TiN backside contact show a defect level with an activation energy of 170 meV. Using all parameters extracted by the different characterization methods for simulations of the two-diode model including injection and recombination currents, we come to the conclusion that our devices are limited by the large recombination current in the depletion region. Potential fluctuations are present in the devices as well, but they do not seem to have a special degrading effect on the devices, besides a probable reduction in minority carrier lifetime through enhanced recombination through the band tail defects.

Using the thermal annealing of evaporated metallic precursors in successive H2Se and H2S atmospheres, it was possible to reproducibly manufacture kesterite absorber material for solar cell applications with a sulfur content varying from 30% to 100%. Respective band gaps for these sulfur inclusions were measured at approximately 1.45 eV and 2.0 eV. A recipe was devised for which results could be reproduced within an error margin of +/- 5% and the influence of the H2S pressure during the post sulfurization was negligible on all measurable and observable parameters. The evolution of the S/Se ratio in the sample was observed to be linearly dependent on the annealing time. It was also observed that at very early stages of the post-sulfurization, both the original Cu-2(Zn,Ge)Se-4 (CZGSe) and a primary Cu-2(Zn,Ge)(S,Se)(4) (CZGSSe) phase with a sulfur inclusion of similar to 30% coexist in the sample. The (112) x-ray diffraction (XRD) reflection of the CZGSe phase progressively disappears in favor for the first mixed CZGSSe phase. Using grazing incidence-XRD, the S/Se ratio was shown to be in homogeneous. Indeed, the XRD measurement of the top layers led to the calculation of higher sulfur inclusions than was the case when measuring the bulk material. Top-scanning electron microscopy (SEM) as well as cross-SEM measurements were taken in order to determine the impact of the sulfur inclusion on the crystal growth and the overall quality of the produced absorber layers. The obtained images revealed a reduction in crystal size and the appearance of numerous holes in the layer as the S/Se ratio is increased. This work was performed within the framework of the SWInG project funded by the European Union's Horizon 2020 research and innovation program, grant agreement No. 640868. M. Neuwirth gratefully acknowledges financial support by the German Federal Ministry of Education and Research (BMBF, FKZ: 03SF0530B) and the Karlsruhe School of Optics and Photonics (KSOP).

Copper indium gallium selenide/sulfide (CIGS) and copper zinc tin selenide/sulfide (CZTS) are two thin film photovoltaic materials with many similar properties. Therefore, three new processing steps - which are well-known to be beneficial for CIGS solar cell processing - are developed, optimized and implemented in CZTS solar cells. For all these novel processing steps an increase in minority carrier lifetime and cell conversion efficiency is measured, as compared to standard CZTS processing. The scientific explanation of these effects is very similar to its CIGS equivalent: the incorporation of alkali metals, ammonium sulfide surface cleaning, and Al2O3 surface passivation leads to electrical enhancement of the CZTS bulk, front surface and reduced front interface recombination, respectively. This work is funded by the Flemish government (Department Economy, Science and Innovation) and the European Union (Horizon 2020 grant agreement No 640868). B. Vermang acknowledges the financial support of the Flemish Research Foundation FWO (mandate 12O4215N).

The aim of this review paper is to describe the impact of so-called border traps (BTs) in high- k gate oxides on the operation and reliability of high-mobility channel transistors. First, a brief summary of the physics of BTs will be given, describing the charge trapping and release in terms of the elastic tunneling model. It will be also pointed out how information on the BT properties can be extracted from popular measurement techniques such as low-frequency (1/f) noise and variable-frequency charge pumping. In the next two parts, the impact of BTs on metal-oxide-semiconductor structures fabricated on Ge or III-V channel materials is outlined, with particular emphasis on the development of novel or adapted measurement techniques such as AC transconductance dispersion or trap spectroscopy by charge injection and sensing. Finally, the effect of BTs on the operation and reliability of high-mobility channel MOSFETs is discussed. It is also shown that the density of BTs is closely linked to the quality or defectivity of the high- k gate stack, indicating room for improvement by optimization of processing or by implementation of a suitable bulk-oxide defect passivation step.

We report on the electrical and physical properties of Cu2ZnSnSe4 (CZTSe) solar cells consisting of an absorber layer fabricated by selenization of sputtered Cu, Zn, Sn multilayers. Cross-section scanning electron microscopy images show that the polycrystalline absorber layers are approximately 1 μm thick and that the typical grain size is of the order of 1 μm. Energy-dispersive X-ray spectroscopy measurements show Cu-poor and Zn-rich compositions with Cu/(Zn + Sn) ~ 0.8 and Zn/Sn ~ 1.2. Solar cells are fabricated out of this absorber material using a standard process flow for chalcogenide solar cells. Under AM1.5 G illumination, the best 1 × 1 cm2 CZTSe solar cell shows an efficiency of 6.3% with a maximum short circuit current of 31.3 mA/cm2, an open circuit voltage of 0.39 V and a fill factor of 52%. Doping density of the absorber layers is derived using the drivel level capacitance profiling (DLCP) technique, showing low p-type doping density which seems to increase exponentially with the Zn/Sn ratio. Comparing the values obtained from DLCP to the ones derived from Mott–Schottky plots of the same devices, it is shown that for CZTSe care has to be taken when deriving the doping density. Similar to copper indium gallium selenide junctions, Mott–Schottky plots overestimate the amount of free carriers in the buffer due to the presence of fast defect states inside the bandgap.

We investigated the use of ternary and quaternary chalcogenide compounds based on Cu, Zn, Sn and Si for use as high band gap absorber layers in thin film photovoltaics. We have investigated ;the fabrication of Cu2Zn(Sn,Si)Se-4, Cu2Si(S,Se)(3) and Cu8Si(S,Se)(6) thin film layers. Whereas, Cu2Zn(Sn,Si)Se-4 and Cu2Si(S,Se)(3) appeared to be difficult to fabricate, because the Si did not intermix well with the rest of the elements at the typical process temperatures used for glass substrates, Cu2ZnSiSe4 and Cu8Si(S,Se)(6) could be formed. The fabricated layers were polycrystalline with a typical thickness of about 1 mu m. We also fabricated solar cells with the different absorber materials, using a standard Mo back contact and CdS/ZnO buffer layer combination, but despite very bright photoluminescence response of the Cu8SiS6 and Cu8SiSe6 layers at an energy of about 1.84 and 1.3 eV respectively, the measured efficiencies remained below 0.1% due to particularly low photocurrents. (C) 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim This research is partially funded by the Flemish government, Department Economy, Science and Innovation. This project has received funding from the European Union's Horizon 2020 research and innovation program under grant agreement No 640868.

Fullerene-based molecules are the archetypical electron-accepting materials for organic photovoltaic devices. A detailed knowledge of the degradation mechanisms that occur in C60 layers will aid in the development of more stable organic solar cells. Here, the impact of storage in air on the optical and electrical properties of C60 is studied in thin films and in devices. Atmospheric exposure induces oxygen-trap states that are 0.19 eV below the LUMO of the fullerene C60. Moreover, oxygen causes a 4-fold decrease of the exciton lifetime in C60 layers, resulting in a 40% drop of short-circuit current from optimized planar heterojunction solar cells. The presence of oxygen-trap states increases the saturation current of the device, resulting in a 20% loss of open-circuit voltage. Design guidelines are outlined to improve air stability for fullerene-containing devices. ispartof: ACS Applied Materials and Interfaces vol:8 issue:15 pages:9798-9805 ispartof: location:United States status: published

We report on the fabrication on InGaAs/InP implant free quantum well (IFQW) n-MOSFET devices on 200mm wafers in a Si CMOS processing environment. The starting virtual InP substrates were prepared by means of the aspect-ratio-trapping technique. Post CMP these substrate resulted in a planar substrate with a rms roughness of 0.32 nm. After channel and gate processing source drain regions were formed by the selective epitaxial growth of Si doped InGaAs. Contact to the source/drain regions was made by a standard W-plug/metal 1 process. The contact resistance was estimated to be on the order of 7x10-7 Ω.cm2. Fully processed devices clearly showed gate modulation albeit on top of high levels of source to drain leakage. The source of this leakage was determined to be the result of the unintentional background doping of the InP buffer layer. Simulations show that the inclusion of the p-InAlAs between the InP and InGaAs can effectively suppress this leakage. This work is a significant step towards the integration of InGaAs based devices on a standard CMOS platform.

The integration of higher carrier mobility materials to increase drive current capability in the next CMOS generations is required for device scaling. But a fundamental issue regarding the introduction of high-mobility III–V in CMOS is the electrical passivation of the interface with the high-κ gate dielectric. In this work, we show that in situ H2S surface treatment on GaAs(001) leads to a stable and reorganized oxide/III–V interface. The exposition of the GaAs surface is monitored in situ by RHEED and the interface is characterized by XPS analyses. Finally, MOS capacitors are fabricated to extract interface state density over the band gap. These results highlight a promising re-interest in chalcogenide passivation of III–V surfaces for CMOS applications.

A critical issue for the successful integration of Ge devices into future high-performance technology nodes is the electrical passivation of the Ge surface. We have examined this electrical passivation in terms of interface and border traps for several Ge-based gate stacks, where we varied amongst others the GeO2 thickness, the high-k material and the Post Deposition Anneal (PDA). The GeO2 thickness seems to have the largest impact, and an inverse relation between the density of interface traps Dit and border traps Nbt exists for GeO2 layers up to ~2 nm. We found that the most optimal passivation is achieved by using an (almost) oxide-free surface as this would result in the lowest Nbt. Although such a surface is characterized by a high mid-gap Dit, this can be improved by performing the correct PDA. We conclude that the most promising oxide-free surface is obtained after an H2S treatment.

A fundamental issue regarding the introduction of high-mobility Ge channels in CMOS circuits is the electrical passivation of the interface with the high-k gate dielectric. In this paper, we investigate the passivation of p-Ge(001) using molecular H"2S. The modification of the semiconductor surface is monitored in situ by RHEED and the interface is characterized by XPS analyses. MOS capacitors are fabricated to extract interface state density, and finally we demonstrate the efficiency of the passivation scheme using a combination with an ultra thin Al interlayer.

Recent developments on CMOS-driven III-V and Ge MOS (Metal-oxide-semiconductor) technologies provide new opportunities in advancing the performance envelope of MOS device as well as the relevant electrical characterization techniques. Understanding the capacitance-voltage (CV) and conductance voltage (GV) responses of the III-V/Ge MOS devices can lead to better assessments of the oxide-semiconductor material systems and more accurate performance predictions.

We will present the defect density at In0.53Ga0.47As and InP interfaces with ALD Al2O3 derived by use of the conductance method and from simulation of low frequency CV-curves. Consequences of the interface state distribution for MOS transistor device operation will be highlighted through 1-dimensional electrostatic simulations. The simulation results will be compared as much as possible to different state-of-the-art transistor results presented in literature.

In this work, we report the selective area epitaxial growth of high quality InP in shallow trench isolation (STI) structures on Si (0 0 1) substrates 6° miscut toward (1 1 1) using a thin Ge buffer layer. We studied the impact of growth rates and steric hindrance effects on the nano-twin formation at the STI side walls. It was found that a too high growth rate induces more nano-twins in the layer and results in InP crystal distortion. The STI side wall tapering angle and the substrate miscut angle induced streric hindrance between the InP facets and the STI side walls also contribute to defect formation. In the [1 1 0] orientated trenches, when the STI side wall tapering angle is larger than 10°, crystal distortion was observed while the substrate miscut angle has no significant impact on the InP defect formation. In the [1 1 0] trenches, both the increased STI tapering angle and the substrate miscut angle induce high density of defects. With a small STI tapering angle and a thin Ge layer, we obtained extended defect free InP in the top region of the [1 1 0] trenches with aspect ratio larger than 2.

We report high quality InP layers selectively grown in shallow trench isolation structures on 6 degree offcut Si (001) substrates capped with a thin Ge buffer layer. The Ge layer was used to reduce the thermal budget for surface clean and double step formation. The atomic steps on the Ge surface were recovered after a bake at 680°C. Smooth nucleation layer was obtained at 420°C on the Ge surface. Baking the Ge surface in As ambient facilitates the InP nulceation and improves the InP crystalline quality. This improvement is attributed to the effective As adsorption on the Ge surface and the polar Ge:As surface prevents the islanding of InP seed layer. Stacking faults were found in the InP layers as a result of threading dislocation dissociation and high quality InP layers were obtained in trenches with aspect ratio greater than 2.

In this paper, we show the results of experiments of InAs nanowire (NW) growth on (111)-oriented Si wafers. The NWs, grown at 620 ° C by metal-organic vapor-phase epitaxy, are vertically aligned and ~30 nm in diameter. Their structural properties are studied by transmission electron microscopy, evidencing a polytypic character, and the vibrational properties by Raman spectroscopy. An assessment of their electrical transport properties is carried out by measuring back-gated, single InAs NW field-effect transistors. The absence of a catalyst ensures the compatibility of the NW growth process with current CMOS technology.

The suitability of oxide/GaAs interfaces for MOSFET applications has been investigated. Electrical properties of Ga2O3/GaAs interfaces, dielectric stacks utilizing the Ga2O3/GaAs interface, and Al2O3/GaAs interfaces have been studied using a set of independent techniques, including admittance-voltage (ac C-V and G-V at 25°C and 150°C), quasi-static static C-V, photoluminescence intensity (PL-I), and MOSFET I-V measurements. The side-by-side comparison reveals the fundamental differences in their respective data sets. The GdGaO/Ga2O3/GaAs system has been found to exhibit a U-shaped Dit distribution with a midgap Dit plateau of 2 - 3 × 1011 cm-2 · eV-1, which has allowed manufacturing GaAs MOSFETs with dc performance close to ideal model predictions. Some other ternary oxides such as GdScO3 and LaAlO3 can also be deposited on a Ga2O3 template without disrupting the Ga2O3/GaAs interface. Beyond GaAs bulk, the use of a surface heterostructure has been investigated, which shifts, in energy space, the mobile charge distribution in the channel layer away from a branch of rising Dit in the vicinity of Ec at the Ga2O3/GaAs interface. In contrast, Al2O3/GaAs(100) interfaces show a typical GaAs native oxide behavior with a

We have deposited III-V alloys on 200 mm Si miscut wafers with an oxide pattern. The selective epitaxial growth (SEG) of GaAs in large windows defined by SiO2 lines on a thick strained-relaxed Ge buffer layer served as a test vehicle which allowed us to demonstrate the integration of a III-V material deposition process step in a Si manufacturing line using an industrial reactor. High quality GaAs layers with high wafer-scale thickness uniformity were achieved. In a subsequent step, SEG of InP was successfully performed on wafers with a 300 nm shallow trench isolation pattern. The seed layer morphology depended on the treatment of the Ge surface and on the growth temperature. The orientation of the trench with respect to the substrate miscut direction had an impact on the quality of the InP filling. Despite of the challenges, such an approach for the integration of III-V materials on Si substrates allowed us to obtain extended-defect-free epitaxial regions suitable for the fabrication of high-performance devices.

High mobility channels are currently being explored to replace the Si channel in future technology nodes. However, until now the promising bulk properties are very difficult to translate into reality due to a bad passivation of the interface between the gate stack and the substrate. In this paper we want to emphasize that gate stack passivation is the result of a complex interplay between the surface treatment and the ALD deposition. During ALD deposition on GaAs, the removal of surface oxides is observed. However, this effect does not lead to a good passivation. For Ge, the S-passivation of the interface is studied in combination with different high-κ. It is clear that the Ge/S/Al2O3 interface is superior to the Ge/S/ZrO2 interface.

A new passivation approach integrating the III-V/Ge MOSFET gate stack processes for a complete CMOS solution is proposed. We explore the In0.53Ga0.47As and Ge MOS electrical properties and present the common gate stack (CGS) concept based on the complementary nature of the asymmetric oxide-In0.53Ga0.47As and the oxide-Ge interface state distributions. In addition, this approach requires neither the interfacial passivation layer (IPL) such as Si, nor the native oxide such as the GeO2, between the gate dielectric and the channels. The oxide-semiconductor interface properties of the common gate stack III-V/Ge MOS system have been carefully investigated and MOS transistors have been fabricated to validate the proposed common gate stack concept. It has been demonstrated that the above common gate stack MOS system can achieve high-performance n-channel operation on In0.53Ga0.47As substrates and p-channel operation on Ge substrates.

Purpose – A regulatory wave will follow the current financial turmoil. The purpose of this paper is to warn that although new regulation is necessary, there is a danger of strangulation of the financial market which can only be avoided with a paradigm shift in the way data are collected and used.Design/methodology/approach – The paper is based on more than 20 years of experience in the field of all types of financial analysis within banks. The idea has been laid down in a doctoral thesis which has been applied in more than 200 banks successfully, including the acceptance by regulators.Findings – Regulators in order to be successful and to regain eye level contact with banks have to use similar techniques as used today within risk management departments or related areas. In addition, however, regulators have to enforce standards especially for the representation of financial contracts, which are called contract types (CT). This would create the long missing international financial language that can be unde...

The use of Ge and III/V materials for future CMOS applications is investigated. Passivation of the Ge surface can be obtained by either GeO2 or a thin Si layer. Short channel Ge pMOS devices with low EOT are fabricated. The passivation of III/V materials is a very challenging topic. Some critical issues and passivation schemes are investigated and the performance of inversion channel MOSFET's on In0.53Ga0.47As with ALD Al2O3 is discussed.