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Oxygen-Induced Degradation in C60-Based Organic Solar Cells: Relation Between Film Properties and Device Performance
- Source :
- ACS applied materialsinterfaces. 8(15)
- Publication Year :
- 2016
-
Abstract
- Fullerene-based molecules are the archetypical electron-accepting materials for organic photovoltaic devices. A detailed knowledge of the degradation mechanisms that occur in C60 layers will aid in the development of more stable organic solar cells. Here, the impact of storage in air on the optical and electrical properties of C60 is studied in thin films and in devices. Atmospheric exposure induces oxygen-trap states that are 0.19 eV below the LUMO of the fullerene C60. Moreover, oxygen causes a 4-fold decrease of the exciton lifetime in C60 layers, resulting in a 40% drop of short-circuit current from optimized planar heterojunction solar cells. The presence of oxygen-trap states increases the saturation current of the device, resulting in a 20% loss of open-circuit voltage. Design guidelines are outlined to improve air stability for fullerene-containing devices. ispartof: ACS Applied Materials and Interfaces vol:8 issue:15 pages:9798-9805 ispartof: location:United States status: published
- Subjects :
- Technology
PHOTOCARRIER DYNAMICS
Materials science
Fullerene
Organic solar cell
Materials Science
Materials Science, Multidisciplinary
TRANSIENT
02 engineering and technology
010402 general chemistry
BLENDS
7. Clean energy
01 natural sciences
Polymer solar cell
ENERGY
Saturation current
WATER
General Materials Science
Nanoscience & Nanotechnology
Thin film
MOLECULAR-OXYGEN
degradation
Science & Technology
STABILITY
business.industry
Photovoltaic system
fullerenes
organic solar cells
Heterojunction
Hybrid solar cell
021001 nanoscience & nanotechnology
DIFFUSION
0104 chemical sciences
STATES
13. Climate action
Science & Technology - Other Topics
Optoelectronics
C-60
0210 nano-technology
business
oxygen
Subjects
Details
- ISSN :
- 19448252
- Volume :
- 8
- Issue :
- 15
- Database :
- OpenAIRE
- Journal :
- ACS applied materialsinterfaces
- Accession number :
- edsair.doi.dedup.....4e8dc47662eedeca97bbd5a3acb74c14