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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

The presence of internal boundaries can significantly influence many important properties of materials, such as fracture toughness, creep, electrical conductivity and magnetic behavior. Interfacial structure, chemical composition and bonding, on a nanometer length scale, are often controlling and sought after factors influencing these properties. An electron spectroscopic technique, known as energy-loss near edge structure (ELNES) analysis, can be utilized to probe compositional and bonding variations with a spatial resolution less than 1 nm and is therefore well suited to this endeavor. When a fast electron passes through a material in an electron microscope, it collides with the electrons bound to the atoms in that sample. As a result, the fast electron often gives up a small fraction of its kinetic energy to the bound electrons. The laws of quantum mechanics dictate that these so-called inelastic scattering events will only take place if the bound electron can gain enough energy to enter an empty energy level.