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4. New layout dependency in high-k/Metal Gate MOSFETs

6. Competitive and cost effective high-k based 28nm CMOS technology for low power applications

7. A cost-conscious 32nm CMOS platform technology with advanced single exposure lithography and gate-first metal gate/high-k process

8. Impact of tantalum composition in TaC/HfSiON gate stack on device performance of aggressively scaled CMOS devices with SMT and strained CESL

32. Coordinated Service Allocation through Flexible Reservation.

34. Electromagnetic properties of bronze processed Nb3Sn superconducting wires and multi-strand...

44. High performance 65 nm SOI technology with dual stress liner and low capacitance SRAM cell

48. MOSFET design of 100 nm node low standby power CMOS technology compatible with embedded trench DRAM and analog devices

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