Development of high-performance polycrystalline silicon thin-film transistors (TFTs) using defect control process technologies.

Details

Language :

English

ISSN :

07413106

Volume :

23

Issue :

7

Database :

Complementary Index

Journal :

IEEE Electron Device Letters

Publication Type :

Academic Journal

Accession number :

52002109

Full Text :

https://doi.org/10.1109/LED.2002.1015218