9 results on '"Alain C. Diebold"'
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2. Advancements in Ellipsometric and Scatterometric Analysis
3. Silicon Semiconductor Metrology
4. Metrology for On-Chip Interconnect Dielectrics
5. Electron Microscopy-Based Measurement of Feature Thickness and Calibration of Reference Materials
6. Overview of Metrology for On-Chip Interconnect
7. Handbook of Silicon Semiconductor Metrology
8. Metal Interconnect Process Control Using Picosecond Ultrasonics
9. Handbook of Silicon Semiconductor Metrology
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