Search

Your search keyword '"Ann Kuo"' showing total 29 results

Search Constraints

Start Over You searched for: Author "Ann Kuo" Remove constraint Author: "Ann Kuo" Publisher aip publishing Remove constraint Publisher: aip publishing
29 results on '"Ann Kuo"'

Search Results

1. Effect of modulating field on photoreflectance simulated by electroreflectance

2. High-dielectric-constant Ta2O5/n-GaN metal-oxide-semiconductor structure

3. Determination of built-in field by applying fast Fourier transform to the photoreflectance of surface-intrinsic n+-type doped GaAs

4. Temperature dependence of Fermi level obtained by electroreflectance spectroscopy of undoped n+-type doped GaAs

8. Influence of an anomalous dimension effect on thermal instability in amorphous-InGaZnO thin-film transistors

9. Dual operation characteristics of resistance random access memory in indium-gallium-zinc-oxide thin film transistors

10. Investigation of channel width-dependent threshold voltage variation in a-InGaZnO thin-film transistors

18. Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor

19. Low power consumption resistance random access memory with Pt/InOx/TiN structure

20. Enhancement of the stability of resistive switching characteristics by conduction path reconstruction

21. High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors

22. Influence of molybdenum doping on the switching characteristic in silicon oxide-based resistive switching memory

23. Application of in-cell touch sensor using photo-leakage current in dual gate a-InGaZnO thin-film transistors

24. Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

25. Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

27. Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

28. Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

29. Enhanced retention characteristic of NiSi2/SiNx compound nanocrystal memory

Catalog

Books, media, physical & digital resources