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Introduction: Ethnic identity is an important protective factor for various ethnic groups and developmental periods. Although existing measures assessing ethnic identity are well known, less is known about the measurement invariance of the Multigroup Ethnic Identity Measure (MEIM) across adolescent ethnic groups. The present study evaluates the factor structure of MEIM (Roberts et al., 1999) and tests the measurement invariance across early and middle adolescence and ethnic background (N = 4940).Methods: Data from an ethnic minority sample of youth (54% girls; Mage = 13.88, grades 6th - 12th; 60% African American, 22% multi-ethnic, 8% Latinx, 5% Asian, 5% American Indian) in the United States of America were examined using confirmatory factor analysis (CFA) and multi-group measurement invariance via a structural equation modeling (SEM) framework. Models for invariance were tested using full information maximum likelihood-robust (FIML-R) estimation in Mplus.Results: CFA supported a three-factor solution (i.e., cognitive clarity, behavioral engagement, and affective pride). The model indicated scalar invariance across early and middle adolescence and partial scalar invariance across the five self-identified racial/ethnic minority groups. There were no grade differences on the ethnic identity factors. Among the racial/ethnic groups, multi-ethnic youth reported the lowest levels on all three ethnic identity factors compared to the other groups.Conclusions: Results of this study point to the validity of using the MEIM for meaningful comparisons of ethnic identity across ethnic groups and across early and middle adolescence. Implications for the interpretation and use of this measure with diverse adolescents are discussed. [ABSTRACT FROM AUTHOR]

The article presents a study on the combined application of quantitative evaluation of mineralogy by scanning electron microscope (QEM-SEM) and hard X-ray microscopy to determine mineralogical associations and chemical speciation of trace metals in the U.S. It notes the reliance of successful trace metal speciation in heterogeneous matrices on a combination of techniques including spectroscopy, microscopy and wet chemical and physical experiments. It highlights the detailed insights provided by the QEM-SEM with micro-focused X-ray diffraction into the composition of mineral assemblages and their effect on trace metal speciation.

The article presents a study on the applications of differential individual particle analysis (DIPA) in particulate matter characterization in the U.S. It notes the permission of in situ DIPA on the same particles to be analyzed in the scanning electron microscope (SEM) before and after modification. However, it highlights the efficiency of the operator-controlled and computer-controlled scanning electron microscopy (CCSEM) approach because of recent developments in silicon drift detectors which have increased the speed of characteristic X-rays detection and very large numbers of particles can be analyzed in a short period of time.