Differential Individual Particle Analysis (DIPA): Applications in Particulate Matter Characterization.

The article presents a study on the applications of differential individual particle analysis (DIPA) in particulate matter characterization in the U.S. It notes the permission of in situ DIPA on the same particles to be analyzed in the scanning electron microscope (SEM) before and after modification. However, it highlights the efficiency of the operator-controlled and computer-controlled scanning electron microscopy (CCSEM) approach because of recent developments in silicon drift detectors which have increased the speed of characteristic X-rays detection and very large numbers of particles can be analyzed in a short period of time.