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The article presents the mining industry has set some ambitious goals regarding sustainability. Topics include the trucks that transport ore from the pit to the primary crusher are responsible for a considerable amount of the carbon emissions at a mining operation, and the crushing and comminution also consume large quantities of energy too.

The article presents the discussion on detecting organophosphate esters in environmental water samples. Topics include Organophosphate esters (OPEs) often used as common flame retardants and plasticizers in plastic foam, electronics, furniture, textiles, and construction materials; and using OPEs having carcinogenicity, neurotoxicity, and hepatoxicity threatening human health and ecosystems.

The article presents a study which examined the changes in the molecular composition and formation of grain fractures in lithium-ion (Li-ion) cells using the correlative Raman imaging and scanning electron (RISE) microscopy. Also cited are the effects of charging cycles on the electrodes of Li-ion batteries, and the use of a lithium nickel manganese cobalt oxide (Li-NMC) cell in the research.

The article presents the profile of EDAX is a leading provider of innovative materials characterization systems encompassing energy dispersive spectroscopy, wavelength dispersive spectrometry, electron backscatter diffraction, and X-ray fluorescence. Topics include company offers microXRF elemental analyzers for small and microspot X-ray analysis and mapping; and services products for a broad range of industries, educational institutions, and research organizations.

The article offers brief information of several equipment for materials science including MFP-3D stand alone atomic Force Microscope from Asylum Research, MMR Duplex Micro Raman System from Lambda Solutions Inc., and Magellan 400 extreme high-resolution scanning electron microscope from FEI Co.

The article describes the accuracy and stability of an automated model calibration technique utilizing scanning electron microscope (SEM) contours for microlithography processes. The benefits of SEM-contour over the critical dimension-based method include providing more diverse topological information for model calibration and saving time in engineering. The areas where engineering time is reduced or eliminated in an automated calibration process is provided.

Focuses on boiler waterside deposition problem in electric power-plants. Discussion on a testing method for measuring the deposit weight density on the furnace of an industrial heat-recovery boiler; Effect of waterside deposition and scaling on boiler tube heat transfer; Use of scanning electron microscope for compositional analysis in industrial management.

Provides information on focused ion beam (FIB)/scanning electron microscope (SEM) systems for testing and failure analysis of integrated circuits. Key capabilities of FIB; Benefit of having an in situ microprobe station within the FIB/SEM chamber; Advantages of a dual-beam FIB/SEM system.

Features several equipments in the manufacturing industries. Features of LSM 5 Pascal confocal laser scanning microscope; Uses of Press Star 7208 hydraulic press; Design of the MF3 infrared radiation thermometers.

A review is presented of JCM-7000 series NeoScope, a benchtop scanning electron microscope from JEOL Ltd.

The article evaluates ceramic industry products including the LHTG and HTK ranges of graphitization furnaces from manufacturer Carbolite Gero, the Vista360 air filter from manufacturer RoboVent and the JSM-IT300HR scanning electron microscope from manufacturer JEOL USA Inc.

A company profile of Mahwah, New Jersey-based innovative spectrometry equipment manufacturer Edax Inc. is presented. It highlights the company description, chief spectroscopic procedures and markets served. Also emphasized is the company's major products and services offered such as X-ray fluorescence, instrumentation equipment and scanning electron microscopes (SEM).

The article discusses specialty engineering company Knighthawk's practice of combining metallurgical, structural and practical applied physics know-how to conduct analyses for the petrochemical and oil refining industries. Topics covered include the company's use of a scanning electron microscope (SEM) to find failure mechanisms, its use of energy-dispersive spectroscopy, and its ability to conduct field metallography. Also mentioned is Knighthawk's computational fluid dynamics model.

The article focuses on the use of a shortwave-infrared (SWIR) camera system instead of scanning electron microscopes (SEMS) in inspecting solar cells. An SWIR sensor identifies defects through the wafer's electroluminescence image. The author discusses how the SWIR system works. An SWIR sensor converts an image into an analog voltage, from which an analog-to-digital converter sends digitized signal to a software for processing. Dark bars resulting from a local reduction of carrier concentration in an electroluminescence image indicate defective cells.

The article discusses a practical approach in reducing high-voltage-induced noise. Acting as an antenna, the floating input of a scanning electron microscope has a high impedance which picks up noise signals. On the other hand, actuators also needs high-voltage signal to drive piezoelectric slip-stick stack motors.

The article discusses tips on improving the performance of field-programmable gate array (FPGA)-pulse-width modulation (PWM) counter. In rewiring modication, output frequency can also be lowered by connecting it to a prescaler where making the frequency fixed makes it easy to calculate. Listings about the FPGA output and simulation results were also provided.

Features the Heidelberg Retina Tomograph, a confocal scanning microscope made by Heidelberg Engineering Inc. of Carlsbad, California, as a tool for managing glaucoma on a long-term basis. Usability; Specifications; Strength and weaknesses; Performance rating.

The article offers information on software equipment for ceramic industry which include the RheocalcT Software v1.2.19 update from Brookfield Engineering Laboratories, the Gemini scanning electron microscope from Zeiss, and the VersaMix multiagitator system from Ross.

The article offers information on a forensic technique called backscatter diffraction developed by the National Institute of Standards and Technology (NIST) in the U.S. Topics include the alteration of the crystal pattern of metal, the use of a scanning electron microscope, and software analysis of crystal damage. It also discusses the need for the backscatter technique to be streamlined.

The article offers brief information on the scanning tunneling electron microscope developed by the company Nion.

Reports on the products introduced by KLA-Tencor Corp. of San Jose, California in November 1999. Price of the PMC-Net yield management and process control software; Information on the eV300 automated scanning electron microscope; Capabilities and features of the products.

Announces the shipment of Applied Materials Inc.'s SEMVision tool, an automated defect review and classification scanning electron microscope (SEM). Key specifications; Application for inline operation within chip production lines; Capability to detect 300 defects per hour; Used of Applied's Multiple-perspective SEM imaging (MPSI) technology.

Discusses Quesant Instruments Corp.'s QScope atomic-force microscope (AFM). Moving-probe scan; Isotropic Focal System; Computer control features; Price range; Contact information.

The article offers news briefs related to mass spectroscopy in the U.S. Wilson College receives a $6,000 grant from the Spectroscopy Society of Pittsburgh (SSP) to acquire a fluorescence spectrophotometer. The University of Colorado at Boulder receives a $1.2 million grant from the W. M. Keck Foundation for its scientific research. The University of Florida scientists identifies the authenticity of a fossil through an energy dispersive X-ray spectroscopy and a scanning electron microscope.

The article evaluates the microCT device for obtaining scanning electron microscope images from Micro Photonics.

The article evaluates the NeoScope JCM-5000 scanning electron microscope from JEOL USA Inc.

The article presents information on an advanced packaging laboratory opened by Panasonic Factory Solutions Co. of America (PFSA) in Buffalo Grove, Illinois. Other labs of the company are located in Germany, Japan, and Singapore. The lab is managed by Gene Dunn, PFSA engineering manager. The lab has scanning electron microscopes, X-ray inspection systems, C-mode scanning acoustic microscopes, and other tools for package analysis.

The article reports on the nanoparticle analysis systems that will be jointly developed by Malvern Instruments Ltd. and FEI Co. in Great Britain. The system will be developed through the combination of the image analysis software and the scanning electron microscopes (SME) of both companies, respectively. Malvern's software will be applied to FEI's SME to enhance particle size, morphology and distribution profiles measurement.

The article reports on the introduction of Jeol USA Inc.'s high-resolution tungsten scanning electron microscopes.

The article investigates the cause of the malfunctioning fire sprinkler system installed at the old Boston restaurant. The investigation applied a compositional analysis in the scanning electron microscope. The analysis shows that the fuse surface was bumpy, as may be caused by melting. It reveals that the boxes had been piled so as to tightly enclose the bulb and fuse, which will cause an accident.

The article reports that Jinchuan Group Ltd., miner and chemical producer has ordered a mineral liberation analyzer (MLA) from JKTech Pty. Ltd. Its MLA software operates a scanning electron microscope to provide automated quantitative mineral analysis. Jinchuan is the largest producer of nickel, cobalt and platinum in China. The company employs more than hundreds of people from its integrated mining, chemical manufacture and service areas. They are currently establishing a Minerals Engineering Research Institute where the MLa installation will be located.

Reports on FEI Co.'s launch of the Titan 80-300 scanning/transmission electron microscope. Features of the microscope.

Presents several cases of physical metallurgy, forensic metallurgy and failure analysis in the U.S. Importance of chemical analyses; Indication of metallography; Result of scanning electron microscope fractographic study.

Focuses on the invention of sticky notes. Formation of a suspension of cross-linked microspheres by acrylate polymers; Viewing of the pebbled surface of the adhesive with a scanning electron microscope; Invention of the adhesive for sticky notes by Spencer Silver.

Reports that scatterometry and offline scanning electron microscope metrology technologies will both be challenged by the metrology needs of the chip industry beyond the 65 nanometer node according to Harry J. Levinson of Advanced Micro Devices Inc. Reason behind the difficulty involved in critical dimension measurement; Effect of scatterometry on the industry; Factors influencing the emerging inline metrology trend.

Introduces the Quanta environmental scanning electron microscope with field emission gun from FEI Co. Applications of Quanta; Features of Quanta FEG.

Investigates the control of biomimetic silica synthesis. Factors influencing morphology of cell-wall silica; Structure of silica precipitated from an tetramethoxysilane aqueous solution; Use of scanning electron micrographs in determining nanospherical silica structures.

Introduces nanoManipulator, a control system designed by researchers at the University of North Carolina, Chapel Hill, for use with a scanning probe microscope. Applications of scanning probe microscopes; Use of the nanoManipulator to manipulate DNA and to study the behavior of the pili fibers that bacteria use as grappling hooks; Combination of an atomic force microscope with a scanning electron microscope.

Introduces 8100XP-R, a critical-dimension scanning microscope (CD-SEM) designed for semiconductor metrology by KLA-Tencor Corp. Features of the electron microscope; Benefits offered.