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PITTCON POTPOURRI: JEOL.

Source :
Chemical & Engineering News. 3/24/2008, Vol. 86 Issue 12, p64-64. 1/5p.
Publication Year :
2008

Abstract

The article evaluates the NeoScope JCM-5000 scanning electron microscope from JEOL USA Inc.

Details

Language :
English
ISSN :
00092347
Volume :
86
Issue :
12
Database :
Academic Search Index
Journal :
Chemical & Engineering News
Publication Type :
Periodical
Accession number :
31577981