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JEOL RELEASES BENCHTOP SCANNING ELECTRON MICROSCOPE.

Source :
GUI Program News. Apr2019, Vol. 30 Issue 4, pN.PAG-N.PAG. 1p.
Publication Year :
2019

Abstract

A review is presented of JCM-7000 series NeoScope, a benchtop scanning electron microscope from JEOL Ltd.

Subjects

Subjects :
*SCANNING electron microscopes

Details

Language :
English
Volume :
30
Issue :
4
Database :
Academic Search Index
Journal :
GUI Program News
Publication Type :
Periodical
Accession number :
135846785