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Your search keyword '"SCANNING electron microscopes"' showing total 4 results
Start Over Descriptor "SCANNING electron microscopes" Publication Type Reviews Journal solid state technology
4 results on '"SCANNING electron microscopes"'

1. FEI's Tecnai Osiris S/TEM goes for speed in analytics.

Author

D. V.

Subjects
*SCANNING electron microscopes, *TRANSMISSION electron microscopes, *EVALUATION
Abstract

The article evaluates the Tecnai Osiris scanning/transmission electron microscope (S/TEM) from Fei Co.

Published
2009

2. FEI eyes 3D structures with intergated SEM/FIB platform.

Author

D. V.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Helios NanoLabx50 DualBeam Series 450(S) and 650 structures for the integration of extreme high-resolution scanning electron microscope (XHR SEM) from Fei Co.

Published
2010

3. Scanning electron microscope.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Nova NanoSEM 30 series scanning electron microscope for Nova Corp.

Published
2007

4. Quanta 3D SEM/FIB Dual Beam.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Quanta 3D FEG analytical DualBeam from FEI Co.

Published
2007

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