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We report on investigation of the mechanical properties of paper electronics (printed and made out of paper). One key objective of such paper electronics is to achieve ultraflexibility. Therefore, it is important to understand electrical functionality and reliability of paper electronics under various physical (mechanical) deformations. Here, we show the general mechanical properties of the cellulose paper used and its electrical behavior under applied strain, tackling the main effects that need to be identified when building paper-based systems, from product performance and stability perspective. An overview of the stress–strain behavior of silver ink on paper is discussed, and then, we tackle a more specific analysis of the performance variations of paper sensors made with recyclable household materials when exposed to various mechanical conditions of tensile and compressive bending. This paper is important for developing stable wearable sensors for incorporation into Internet of Everything applications. [ABSTRACT FROM PUBLISHER]

Several miniaturized viscometers, or microviscometers, have been developed exploiting numerous rapid prototyping techniques. Among them, paper microstrips, famously known as microfluidic paper-based analytical devices ($\mu $ PADs), have become popular due to their cost-efficacy, simple fabrication, fast response, and easily disposable. Many fabrication methods are existing to develop paper microstrips. Herein, an alternative fabrication method is proposed where fused deposition modeling (FDM)-based 3-D printer (3DP) has been employed using polycaprolactone (PCL) filament. F, image processing has been utilized to measure viscosity in such microfluidic domain. Viscosity was calculated by measuring the time taken by the fluid to cover a fixed length between two spots in the microchannel based on the programed and color-coded regions-of-interest. The image processing program was developed considering the change in the gray scale in the virtual region of interests (ROIs) in the microchannel during the fluid flow in the paper microstrips. A 3-D printed handheld platform, containing raspberry pi with on-board camera and display, was developed to execute the image processing and automate the entire work flow. In the proposed device, the accuracy was measured to be >92%. [ABSTRACT FROM AUTHOR]

Oxide-based thin-film transistors (TFTs) with a lateral in-plane electrode are self-assembled on paper substrates, and the electrical modulation effect of the in-plane electrode is investigated. A \SiO2-based solid-electrolyte film with high specific capacitance is used as the gate dielectric, and the operation voltage is reduced to less than 2.0 V. The threshold voltage (Vth) of such paper TFTs is tuned from -0.98 to 0.94 V by different voltage biases on the in-plane electrode. The threshold voltage shift (\Delta Vth) can be described by \Delta Vth = -(CG2/CG1)VG2, where CG2 and CG1 are the in-plane electrode and bottom-gate specific capacitance values. High electrical performance with a current on/off ratio of \6 \times \10^5 \sim \10^6, a subthreshold swing of 0.14 \sim 0.19 V/dec, and a mobility of \8.64 \sim \9.45\ \cm^2/\V\cdot \s is obtained at different in-plane electrode voltage biases. Such low-voltage paper TFTs are promising for low-cost and portable electronics. [ABSTRACT FROM PUBLISHER]

Alternating-current-type inorganic powder electroluminescence (PEL) devices were successfully fabricated on four kinds of paper substrates, i.e., glossy paper, sticker paper, magazine paper, and newspaper. To protect the paper from wet chemical and heating processes during the formation of the PEL device, the paper substrate was coated with a spin-on-glass layer that served as a buffer layer. In spite of the fragility of paper, quite satisfactory results were obtained--the performance of paper-based PEL devices was almost equivalent to that of PEL devices on a plastic substrate. Extension of a substrate to paper, even to flimsy daily newspaper, will widen the opportunity of PEL devices as one of flexible and disposable displays. [ABSTRACT FROM AUTHOR]

The electrophoretic display (EPD) is the main solution to electronic papers, but most of them can display the image or text in black and white particles only. The users may prefer the EPD showing multiple colors rather than the black/white content only. In this paper, we introduce the driving system for a color EPD, which is composed of three kinds of particles. The system aims at optimizing the visual quality based on a new driving waveform by equipping with an optimization method for color and tone reproduction. The experimental result shows that the proposed EPD driving system can display three-color pictures with promising visual quality. [ABSTRACT FROM AUTHOR]

Describes the above-named upcoming special issue or section. May include topics to be covered or calls for papers. [ABSTRACT FROM AUTHOR]

This paper reports an industry standard monolithic 555-timer circuit designed and fabricated in the in-house silicon carbide (SiC) low-voltage bipolar technology. This paper demonstrates the 555-timer integrated circuits (ICs) characterization in both astable and monostable modes of operation, with a supply voltage of 15 V over the wide temperature range of 25 °C–500 °C. Nonmonotonic temperature dependence was observed for the 555-timer IC frequency, rise time, fall-time, and power dissipation. [ABSTRACT FROM AUTHOR]

This paper provides an industry perspective on the present state of compact models for MOS transistors. It highlights the complexity of layout-dependent effects in modern transistors, reviews some common misunderstandings of MOS transistor capacitances, and introduces a new, structurally symmetric, “gate-as-input” equivalent network for these capacitances. Areas of focus for the future model developments are also proposed. [ABSTRACT FROM AUTHOR]

Microporous SiO2 can provide large electric-doublelayer (EDL) capacitance and negligible leakage current, owing to lack of electron carrier and limited mobility of mobile ions. The impedance spectroscopy (ionic-conductivity--frequency and capacitance--voltage characteristics) and Fourier-transformed infrared spectroscopy of microporous SiO2 are characterized, which demonstrated that such dielectric is actually a solid-electrolyte dielectric. InGaZnO4 thin-film transistors (TFTs) on paper substrates gated by microporous-SiO2 solid electrolyte are fabricated at roomtemperature.The largeEDL-specific capacitance (1.36 µF/ cm²) results in the paper TFTs operate at a battery-drivable low voltage of 1.0 V. Both depletion-mode (Vth = .0.45 V) and enhancement-mode (Vth = 0.25 V) operations are realized by rationally controlling the oxygen concentration in argon ambient during InGaZnO4 channel deposition. Electrical characteristics with an equivalent field-effect mobility of ~21 cm²/V ⋅ s, a current ON/OFF ratio of greater than 105, and a subthreshold swing of ~80 mV/dec are demonstrated at low frequencies, which are promising for portable paper electronics. [ABSTRACT FROM AUTHOR]

During the past few years, we have seen an increasing number of submissions of “physics-based simulation only” papers to the IEEE TRANSACTIONS ON ELECTRON DEVICES (T-ED). The popularity of such papers may be explained by the fact that the present widespread technology computer-aided design (TCAD) tools are a significant and welcome boost to creativity in the electronic device community. In fact, TCAD tools allow researchers to explore and optimize device structures without being burdened by technology concerns in terms of availability, cost, and time delay. [ABSTRACT FROM AUTHOR]

We demonstrate edge electron emission from flexible free-standing graphene paper (GP). The turn-on field is measured at 2.2 V/ \mum , and the maximum emission current density at 3 A/cm^2 . The field emission properties of GP can be optimized by adjusting the thickness and annealing temperature. Because it is flexible, it can be shaped into different forms to meet the requirements of specific applications. The electron beam shape can range from a sheet electron beam to a cylindrical (hollow) electron beam. [ABSTRACT FROM AUTHOR]

Describes the above-named upcoming special issue or section. May include topics to be covered or calls for papers. [ABSTRACT FROM AUTHOR]

A novel vertical architecture for all-printed organic electrochemical transistors, based on poly(3, 4-ethylenedioxythiophene):poly(styrene sulfonate), realized on flexible substrates, is reported. The transistors are manufactured along both faces of plastic or paper substrates and via connections are realized using laser ablation or simple punch through using a pin. Successful modulation of the electric current that flows between the two sides of the substrate is achieved using electrolyte-gating and electrochemical modulation of the electronic charge transport of the bulk of the transistor channel. In addition to this, the transistors are exhibiting fast switching and high ON/OFF current ratios. [ABSTRACT FROM AUTHOR]

The article offers information of Technology Computer-Aided Design (TCAD) which refers to the use of computer simulations to develop and optimize semiconductor process technologies and devices.

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers. [ABSTRACT FROM AUTHOR]

An introduction is presented in which the editor discusses articles in the issue on topics including IEEE Transactions on Electron Devices on New simulation methodologies for next-generation TCAD tools, and large-scale simulations.

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers. [ABSTRACT FROM AUTHOR]

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers. [ABSTRACT FROM AUTHOR]

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers. [ABSTRACT FROM AUTHOR]

Since 2017, the IEEE Transactions on Electron Devices (TED) has published a selection of extended versions of papers presented at the Symposia on VLSI Technology and Circuits held in the corresponding years (vol. 64, no. 10; vol. 65, no. 11; vol. 66, no. 12). Since 2018, the papers have been collected in a Special Section of TED titled “Papers from Symposium on VLSI Technology.” This initiative, which was the result of a fruitful cooperation between the Electron Device Society and the VLSI Symposium chairs and committees, has brought to TED a number of carefully selected (by the VLSI TPC first and then through the TED usual review process), high-quality submissions. We have been able to continue this cooperation also in this difficult 2020, and we are therefore happy to announce the publication in the December issue (Vol. 67, No. 12) of a Special Section on papers from the 2020 Symposium, held virtually on June 15–19, 2020. A special thanks to the Guest Editors of the section, Peide Ye, Purdue University (Publication Chair, 2020 VLSI Symposium), and Masaharu Kobayashi, The University of Tokyo, Japan (Publication Co-Chair, 2020 VLSI Symposium). [ABSTRACT FROM AUTHOR]

We have fabricated fully transparent high performance flexible nickel-doped zinc oxide thin-film transistors (NZO TFTs) on flexible plastic substrates using magnetron sputtering. The effects of active layer thickness on the performance of NZO TFTs was investigated. We found that the channel layer thickness has a notable influence on the characteristics of NZO TFTs. The electrical characteristics of NZO TFTs reached the optimization when the active channel layer thickness was 71 nm, with a low off-current lower than 1 pA, a high on/off drain current ratio of 2.1 \times 10^9 , a high saturation mobility of 27.5 cm ^2\cdot \mathrm V^-1\cdot \mathrm s^-1 , a steeper subthreshold swing of 67 mV/decade, and a low threshold voltage of 1.88 V. It is demonstrated that NZO is a promising active channel layer materials for future transparent flexible displays. [ABSTRACT FROM AUTHOR]

Flexible, highly sensitive, easy fabricating process, low-cost pressure sensors are the trend for flexible electronic devices. Despite the tremendous progress in recent years, it is still challenging to prepare pressure sensors with high sensitivity, high stability, and fast responsiveness. In this study, we report a simple and low-cost method for the preparation of novel pressure sensors. Inspired by the pomegranate structure, a 3-D porous structure consisting of polystyrene (PS) microspheres filled with reduced graphene oxide (rGO) paper is proposed. This pressure sensor has high linear sensitivity (1.41 kPa−1 in the pressure range of 0–50 kPa), high stability (1000 cycles), and quick response time (~20 ms). Furthermore, a robotic arm interacting control system based on pressure sensor arrays is constructed, which demonstrates the far-reaching potential of pressure sensors in human–machine interaction. Therefore, this work provides a low-cost and effective method for preparing high linear sensitivity pressure sensors. [ABSTRACT FROM AUTHOR]

An electrophoretic display (EPD) cell with a triple-layered microcavity structure was fabricated using a convenient dry film resist. The inherent structural advantage arising from the function of the middle channel layer as a background colored state enabled the EPD to operate with two different-colored states by using a single type of electronic-ink particles, thereby eliminating the possible agglomeration of oppositely charged ink particles and supporting the potential application of the proposed structure to color the electronic paper. The preliminary operation of this new EPD structure was demonstrated as white and blue display states on a rigid glass exhibiting a contrast ratio of 1.5 : 1 with saturation voltages of +30 and -30 V, respectively. Successful demonstrations on both the indium–tin–oxide-patterned glass and flexible polyethylene substrates are also provided. [ABSTRACT FROM AUTHOR]

This Special Issue of the IEEE Transactions on Electron Devices will feature the most recent developments and the state of the art in the field of ultra wide band gap semiconductors and devices for power control and conversion, including both experimental results and theoretical developments. Papers must be new and present original material that has not been copyrighted, published or accepted for publications in any other archival publications, that is not currently being considered for publications elsewhere, and that will not be submitted elsewhere while under considerations by the Transactions on Electron Devices. Topics of interest include, but are not limited to: IDtra Wide Band Gap Materials: Advances in material synthesis, defect characterization, transport and high-field properties, and material-level integration; evaluation of fundamental materials-limited figures of merit; Power Devices: Vertical and lateral MOSFETs, HEMTs and MIS-HEMTs, IGBTs, Schottky and pn junction rectifiers, and other device concepts; fabrication and device characterization; designs and device structures for controlling field profiles, edge termination; Thermal Management: Approaches to mitigate thermal effects in power devices using ultra wide band gap materials; Integration: Monolithic and heterogenous integration for system-level applications using ultra wide band gap materials. Integration with Si or other semiconductors for system-on-chip and system-in-package implementations, including heterogenous and package-level integration for high-performance power conversion applications. [ABSTRACT FROM AUTHOR]

An introduction is presented in which the editor discusses various articles within the issue on topics including research and development in compact models, metal oxide semiconductor field-effect transistors (MOSFET) modeling and RF Compact Model for Bulk MOSFET.

The article presents invitation for posters and papers for the 2013 IEEE International Reliability Physics Symposium (IRPS) to be held in Monterey, California from April 14-18, 2013. Among the areas where papers should be focused include electronic systems, automotive reliability, and circuit aging simulation. It notes the awards to be given by IRPS including Outstanding Paper, Best Student Talk, Best Poster, and Best Paper.

A high-resolution active-matrix microencapsulated electrophoretic display (EPD) driven by polycrystalline-silicon thin-film transistors (poly-Si TFTs) with integrated drivers has been developed for the first feasibility study of electronic paper. The poly-Si TFTs were fabricated with a low temperature process below 425 °C. Microencapsulated electrophoretic material was coated on the TFT backplane, which was driven at 18 V. The resolution of the display is quarter VGA (video graphics array), and pixel pitch is 131 ppi (pixels per inch). As a result, this display offers a wide viewing angle, high contrast ratio and nonvolatilization of data. In addition, four-level grayscale images were also achieved by using an area ratio grayscale (ARG) driving method. [ABSTRACT FROM AUTHOR]

The first part of this paper presented mymargin the device-level comparison of emerging materials (In0.53Ga0.47As and 2-D materials) and device architecture (NW FETs) with s-Si FinFETs. In order to further understand the performance and energy efficiency of these device options for future technology nodes, it is required to go beyond the device-level comparison by accounting for not only intrinsic but also the extrinsic parasitic elements. In this paper, we present the comparison of s-Si, In0.53Ga0.47As, and 2-D material-based n-type MOSFETs using the circuit-level figure of merits across three successive future technology nodes. The analysis incorporates both device characteristics obtained from an advanced quantum mechanical simulation tool and circuit-level comparison, which accounts for device parasitic elements and wiring load. The results show that 2-D material DG MOSFETs present a more energy-efficient device option than s-Si and In0.53Ga0.47As FinFETs in sub-0.7-V supply voltage regime and In0.53Ga0.47As nanowire (NW) FETs can outperform s-Si multi-gate (MuG) FETs and 2-D material FETs, but when considering non-idealities, s-Si NW FETs remain both faster and more energy-efficient device option. [ABSTRACT FROM AUTHOR]

In recent years, triboelectric nanogenerators (TENGs) have been increasingly attracting attention owing to the ability for converting multiple mechanical energy into electricity. In this paper, we first propose a multifunctional conductive copper tape-based TENG (CCT-TENG) that is constructed completely using one piece of conductive copper tape. The triboelectric pairs, supporting structure, and conductive electrode were composed using bottom paper, silicone oil, and copper foil, all of which came from one roll of conductive copper tape. The approximate output power density of the CCT-TENG reached $240.1~\mu \text{W}$ /cm2. By spraying the aqueous solution of LiCl onto the surface of the bottom paper, a CCT-TENG incorporating LiCl was fabricated and used as a self-powered active sensor to detect the relative humidity (RH) of the environment. The obtained results revealed that the humidity sensor had good humidity response, response linearity, and reversibility. In addition, the RH was reflected by the brightness of light-emitting diodes (LEDs) that was driven by the humidity sensor. This paper realizes a promising, affordable, and portable integration of power supply systems and sensing systems, which can promote the application of TENG in the field of electronic detection device and environment monitoring. [ABSTRACT FROM AUTHOR]

Describes the above-named upcoming special issue or section. May include topics to be covered or calls for papers. [ABSTRACT FROM AUTHOR]

This Special Issue is dedicated to recent research in the field of compact modeling for circuit design. The topics included all device structures, provided it was demonstrated that the presented compact modeling solutions were implementable in circuit design tools. The last Special Issue addressing compact modeling of all types of semiconductor devices was published in 2006. Since then, new device structures, and with different materials, have emerged, and significant and successful research in compact advance device modeling has been done, as well in the application of compact models to circuit design. Therefore, a new Special Issue was needed that could include high-quality papers in these topics. [ABSTRACT FROM AUTHOR]

In part I of this paper, we developed physical insights into the role and impact of acceptor and donor traps—resulting from C-doping in GaN buffer—on avalanche breakdown in AlGaN/GaN HEMT devices. It was found that the donor traps are mandatory to explain the breakdown voltage improvement. In this paper, silicon doping is proposed and explored as an alternative to independently engineer donor trap concentration and profile. Keeping in mind the acceptor and donor trap relative concentration requirement for achieving higher breakdown buffer, as depicted in part I of this paper, silicon & carbon codoping of GaN buffer is proposed and explored in this paper. The proposed improvement in breakdown voltage is supported by physical insight into the avalanche phenomena and role of acceptor/donor traps. GaN buffer design parameters and their impact on breakdown voltage as well as leakage current are presented. Finally, a modified Si-doping profile in the GaN buffer is proposed to lower the C-doping concentration near GaN channel to mitigate the adverse effects of acceptor traps in GaN buffer. [ABSTRACT FROM AUTHOR]

A high-harmonic traveling-wave tube (HHTWT) is designed, developed, and tested in this paper. This device is configured as a multiplier–amplifier with Q-band input signals and its third harmonic, i.e., D-band output power. The tested result demonstrates that 280 mW at 133.5 GHz is obtained as a result of 200 mW at 44.5-GHz input signal. The simulation and experiment validate that the high-harmonic radiation can be generated and amplified in the HHTWT. The approach described in this paper could find application in exploring high power, wideband tunable terahertz source. This paper is expanded from a conference paper on IVEC 2017. The detail design produce and tested result are added in this paper. The explanation of the simulation and tested results is also presented. [ABSTRACT FROM AUTHOR]

The article highlights call for papers from Ieee Transactions on Electron Devices on several topics including advanced transistors; gate dielectrics; and power devices.

The article invites, papers from authors for a special issue of the journal "IEEE Transactions on Electron Devices" on "Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices."

The article presents the invitation of the journal to interested individuals to submit papers and articles on memory, logic and CMOS devices.

Describes the above-named upcoming special issue or section. May include topics to be covered or calls for papers. [ABSTRACT FROM AUTHOR]

Describes the above-named upcoming special issue or section. May include topics to be covered or calls for papers. [ABSTRACT FROM AUTHOR]

Describes the above-named upcoming special issue or section. May include topics to be covered or calls for papers. [ABSTRACT FROM AUTHOR]

Describes the above-named upcoming special issue or section. May include topics to be covered or calls for papers. [ABSTRACT FROM AUTHOR]

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers. [ABSTRACT FROM AUTHOR]

The article offers information on electronics devices, complementary metal–oxide–semiconductor (CMOS) logic, power and memory. Topics discussed include electronics devices with features related to experimental results and theoretical model; include advanced transitory with features of self-heating effect and variability; and discusses power devices like the metal–oxide–semiconductor field-effect transistor (MOSFET) and insulated-gate bipolar transistor (IGBT).

The article talks about the reliability of electronic devices as an issue for technology, impact of Bias Temperature Instability on CMOS logic devices and evolving Hot Carrier Degradation and Self Heating Effect. It talks about degradation of program window, development in the field of device reliability and topics that includes Advanced Transistors, Gate Dielectrics and Memory Devices.