Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices.

The article talks about the reliability of electronic devices as an issue for technology, impact of Bias Temperature Instability on CMOS logic devices and evolving Hot Carrier Degradation and Self Heating Effect. It talks about degradation of program window, development in the field of device reliability and topics that includes Advanced Transistors, Gate Dielectrics and Memory Devices.