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The article presents the proceedings of the IEEE International Test Conference in Austin, Texas from November 8-10, 2005. Several papers and research works presented and discussed in the event. New technologies such as submicron technology have been developed for the test industries. The conference introduced seminars on testing areas such as delay testing, mixed-signal and radio frequency testing, microprocessor testing and debug, and very-high-frequency and jitter testing.

Information about the International Test Conference 2009 held in Austin, Texas on November 3-5, 2009 is presented. Topics include design verification, test, diagnosis, failure analysis, and design improvement of electronic devices, boards and systems. It also features a large exhibit of the equipment, software, services and tools that can be used in solving problem tests. The symposium is held with a panel of experts.