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Past TTTC Events.
- Source :
- IEEE Design & Test of Computers; Jan/Feb2010, Vol. 27 Issue 1, p90-90, 1/2p
- Publication Year :
- 2010
-
Abstract
- Information about the International Test Conference 2009 held in Austin, Texas on November 3-5, 2009 is presented. Topics include design verification, test, diagnosis, failure analysis, and design improvement of electronic devices, boards and systems. It also features a large exhibit of the equipment, software, services and tools that can be used in solving problem tests. The symposium is held with a panel of experts.
- Subjects :
- CONFERENCES & conventions
ELECTRONICS conventions
ELECTROMECHANICAL technology
Subjects
Details
- Language :
- English
- ISSN :
- 07407475
- Volume :
- 27
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- IEEE Design & Test of Computers
- Publication Type :
- Academic Journal
- Accession number :
- 48681640