2005 International Test Conference.

The article presents the proceedings of the IEEE International Test Conference in Austin, Texas from November 8-10, 2005. Several papers and research works presented and discussed in the event. New technologies such as submicron technology have been developed for the test industries. The conference introduced seminars on testing areas such as delay testing, mixed-signal and radio frequency testing, microprocessor testing and debug, and very-high-frequency and jitter testing.