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The article focuses on the use of benchtop instruments to improve the capabilities of modular instruments. It offers information on equivalent test system that can be developed by inserting instrument modules into one chassis. It mentions that modular instruments market rose to 1.12 billion dollars and expected to double by 2023 to 2.11 billion dollars.

The article discusses the critical automatic test equipment (ATE) requirements for parametric test of optically networked weapon systems. It states that the ongoing test requirements for military applications are unique that require new equipment capabilities to augment current test systems, affecting all stages of test in factories, field and depots.

This article presents information on the Autotest 2014 show held in Saint Louis, Misosuri in September 2014, which showcased automated test systems for military/aerospace equipment. Products featured during the event include the M9290A CXA-m PXIe signal analyzer from Keysight Technologies, the RouteWarePRO 4.0 software from Universal Switching and the PXI product line unveiled by ADLINK Technology.

The article reports that modular instrumentation are available in the form of kits. Switching modules support only certain circuit configurations such as multiplexers or matrices. Several manufacturers provide high-speed digitizers with 12 or 14 bits of resolution. ADLINK's 14-bit PCIe-9852 two-channel 200- MS/s digitizer includes onboard signal averaging.

The article focuses on the importance of the VXI modular solution in recent times. VXI is used in many Aero automated test systems (ATS). The VXI standard has a track record as an architecture, which can be trusted for applications who are in need of a long life cycle. The VXI board size and power budget are different from smaller formats such as PXI with a power budget

The article offers information on radio frequency/microwave test systems for military and aerospace applications. It is said that these systems face multiple mandates: high performance, long life, upward migration paths and low cost. Technology company Racal Instruments Inc.'s 257A RF interface units (RFIUs) include relay counters to monitor end of life.

The article discusses a method for improving the long-term reliability for a population of electromechanical (EM) relays. It is said that the cost of replacing a defective component before shipping the end product is less. The testing method, contact resistance stability (RDEL), can assure that multiple readings are consistent with small variations.

The article offers information on switch modules used for test applications. It is said that micro-electro-mechanical systems (MEMS) switches are not condidered by major test equipment manufacturers to be ready for prime time, particularly not for the test applications already served by modules based on relay and solid-state technologies.

The article discusses software support for mission-critical military and aerospace systems (MIL/Aero). Software developed by Agilent Technologies Inc., Geotest-Marvin Test Systems Inc., and National Instruments Corp. have been used by organizations including Astronics DME, BAE Systems, Edwards Air Force Base, Embraer, Lockheed Martin, and NATO in MIL/Aero applications. MATLAB-based tools can also used in MIL/Aero applications. .

The article discusses the use of matrix switching systems which offer a solution for signal switching in test systems. Nick Turner, president of instrument maker Cytec, pointed out size limitations for matrices and multiplexers. He said that signals which connect to a large number of relay contacts in parallel, such as in a big matrix, the overall capacitance of the contacts limits high-frequency performance.

The article discusses the factors that need to be considered when designing a high-density switching system. According to the author, the factors include the test system form factor, the switch architecture, voltage, current and power trade-offs. He adds that the switch should operate well within its specifications even at low frequencies to remain reliable. He discusses various types of switching systems and their applications which include solid-state, feed relays, electromechanical relays.

The article discusses the importance of applying a standardized and consistent procedure for measuring concurrent test efficiency (CTE). CTE is a way to determine how well the test method is applied and how well the design of the device is able to support a concurrent test process. One benefit is that it helps in estimating the test times for new instruments. CTE may also help in figuring out the effects of changes in the test setup or design of the device to be tested.

The article offers information on switching in an automated test system. The common problems with the implementation of switching include misunderstanding the effects of the need of using great amounts of transmission lines and not making sure that the switch has adequate bandwidth. It cites some of the best practices developed by engineers to eliminate the problems. A star switch refers to a multithrow switch without the pole or common. The advantages of using a star switch are also cited.

The article discusses the standards of electromagnetic compatibility (EMC) testing. A brief overview is given on two actual test examples which illustrate the range of situations facing EMC test laboratories. It describes the EMC test compliance achieved by Komatsu and General Motors. It also discusses the approach for dealing with EMC for one's next design project. Information is given on the evolution of EMC standards and EMC requirements. It outlines the specific recommendations of the Intertek white paper involving EMC test compliance.

A list of companies that offer automated test equipment, which include Agilent Technologies, Geotest-Marvin Test Systems, and National Technical Systems, is presented.

The article discusses the advantages of memory test system with breakthrough parallelism. One way of reducing cost of test (COT) for high-volume production is to increase the parallelism of the tester. Cost is the first disadvantage of increasing parallelism since pin electronics (PE) cost scales directly with parallelism. In addition, added power and associated cooling increase the space needed for the PE. The Active Matrix technology of the Verigy V6000 test platform provides high parallelism with the flexibility to meet a range of test needs at a lower cost.

The article discusses emerging synthetic instruments (SI) and IVI driver solutions. The U.S. Department of Defense's Synthetic Instrument Working Group (SIWG) offered an original definition of SI in 2004 as elemental hardware and software components with standardized interfaces and measurements software which yield a smaller footprint and greater flexibility. The manner in which how an entire test system works is described. The article also explores several emerging standard software input/output (I/O) interfaces for SI.

The article presents information on the evolution of optical transceiver test. It is noted that the basic component of an optical communication system is consist of a transmitter, a fiber channel, and a receiver. It is important to know how good or bad the receiver and channel will be for the receiver specifications to set the transmitter specifications. The key requirements for the transmitter are based on the receiver needing a wide separation are discussed. It also describes the process of modern bit-error-ratio (BER) test system and its pattern generators design to produce calibrated levels of distortion or stress.

The article discusses the development of an automated test-solution (ATE) for current and next-generation complex Radio Frequency (RF) Single Inline Package/System Operating Procedure devices. The first step in the development of the device interface board (DIB) is the mapping of available system resources to the device pin requirements. A reference clock signal connected to all four sites in parallel must be sourced by the ATE system. An ATE RF instrument with universal ports is essential to simplify the DIB design problems. Test program development is the second challenge in the development. Majority of the program should be developed using pattern-oriented programming in order to achieve the highest parallel test efficiency.

The article focuses on dealing with commercial off-the-shelf (COTS) equipment obsolescence which is called legacy instrument replacement. Among the many elements complicating legacy instrument replacement is the investment already made in the related test program sets (TPS). It states that with a direct form, fit and function (FFF) solution, one simply replaces the old instrument and carries on as before. According to David Manor of Geotest-Marvin Test Systems, all of their FFF replacement instruments use a field programmable gate array (FPGA)-based architecture, which provides them the flexibility to easily update functionality in the factory or in the field.

The article discusses the advantages of LAN extensions for instrumentation (LXI) and scripting. Scripting is considered a powerful and convenient way to give programmability for instruments in test and measurement applications. Basically, scripting is writing programs in a scripting language to coordinate a sequence of actions. Script programs, compared to other programming languages, do not require to be precompiled before being run. Examples of popular scripting languages are Perl® Python®, VBScript® and JavaScript®. On the other hand, LXI instruments have a Telnet port that can be applied for remote control.

The article talks about tools that are available for programming a LAN extensions for instrumentation (LXI) system. Vendors like Agilent Technologies, Data Translation, The MathWorks and National Instruments have adapted their application development environments to support LXI system development. Programming an LXI instrument is not considerably different than programming other classes of instruments when working with familiar development environments. With Measure Foundry, the standard method to program LX instruments using property pages and no coding is with the Professional Version, a requirement for connecting either the Instrument Pak or Advanced Instrument Pak, both of which add objects to access the IVI-COM interface through property pages.

The article discusses the types of switching systems and instruments used in automated testing. It is stated that the growing popularity of Ethernet-based LXI instruments has allowed manufacturers to separate form from function to a large degree. A comparison between VXI and PXI switching modules is presented. According to the article, a typical VXI modules are 6U high and offer a much larger PCB area than the usual PXI 3U modules. It is noted that competition between the two standards are influenced by the test systems used within a company.

The article offers four diverse data acquisition (DAQ) projects as examples of optimum solutions to complex test and measurement applications. Each system employs a wide range of measurements and satisfies several constraints. The U.S. Department of Energy has established a number of high-technology projects as part of an initiative to improve the capacity and reliability of the country's electricity grid including the development of a 138-kV Saturable Reactor type of fault current limiter (FCL) by SC Power Systems. C&H Technologies has developed an Aperture ADC on an M Module for use on a VXI carrier in the VXI test system of the customer experiencing long analysis time on multiple channels of digitized analog data.

The article focuses on board shorts testing. The author claims that because of reduced access, lower voltage rails and other effects of high-functionality designs, the process of finding board shorts became more complex. Shorts testing is identified as unpowered in -circuit analog impedance method that can easily detect possible electrical failures. It is aimed at avoiding damage to the board that could happen if it were designed for subsequent digital logic, boundary scan and component testing.

The article focuses on the use of common core automated test systems for functional testing. In order to lessen overall cost and to increase flexibility, the approach to high-end aerospace/defense test system development is moved from application-specific systems to common core automated systems. Proprietary legacy systems are being replaced by common core test sets using commercial-off-the-shelf (COTS) hardware and open software environments. Under a subcontract for Lockheed Martin Missiles and Fire Control (LMMFC) in Dallas, G Systems recently developed a common core automated test system to examine and confirm multiple functions of a new missile launcher for the Non-Line-of-Sight-Launch System (NLOS-LS).

The article discusses how midplane quality can be ensured through boundary scan tests, with particular focus on the chassis-level products testing at Alcatel-Lucent. The author notes that the team filled all empty slots to perform functional slot testing in addition to the tests made with the boards designed for integration into a customer's equipment. He adds that the team decided to add a post-assembly interconnect test to reduce the time needed to return a defective chassis to the contractor.

The article looks at the impact of a test-driven approach on embedded software development. The author stresses the importance of having a new unified, test driven approach that adopts early developer testing practices and implements automated software. He reports that embedded software development has increased rapidly to support semiconductor technology and processes which have continually improved to produce more densely integrated and feature-packed silicon.

The article presents information on microwave test systems. To ensure that system design parameters are met, the right components to control signal flow, signal level and signal integrity must be chosen. Topics discussed include attenuators, RF switches, directional couplers, power splitters and dividers, resistive power splitter/divider, lossless power splitter/divider, and circulators and isolators.

The article states that the R&D manager wants to see the design verification test results and will not approve the release of the design until the environmental characterization results are reviewed. Oscilloscope can be used for testing time-domain devices in combination with automation software. Developing a test code can transfer tests quickly to manufacturing test system which can be facilitated by XML.

Provides information on the Technology Insertion for Legacy Systems (TILS), an emulation strategy that addresses the problem of instrument obsolescence in test systems. System used by TILS to translate instrument commands in real time to emulate the original system; Process of instrument selection in TILS; Architectural decisions to consider in developing emulators for obsolete instruments.

Focuses on the development of the PXI-based tester designed to meet Maverick missile test requirements in the field and back shop as well as provide support for future Maverick components, by Raytheon Missile Systems and Geotest-Marvin Test Systems. Design goals of the test set; Details of the design phase; Features of the command and control subsystem of the tester.

The article focuses on maximizing the performance capability of conducted immunity test systems. There has been inefficiency within the present conducted immunity test systems in 2005. A conducted radio frequency immunity test must meet several key requirements which include the ability to produce repeatable results. An alternating current filter has the ability to block high-frequency common-mode interfering signals.

Discusses the use of gigahertz transverse electromagnetic cell in the upgrade of an in-house radio frequency (RF) emission system. Comparison between emissions testing and immunity testing; Distinction between open-loop field generation and closed-loop field generation; Test equipment required in converting test systems; Activities for system commissioning.

Presents several factors to consider in selecting a personal computer plug-in digital multi-meter (DMM) for a test system. Considerations in selecting a system software; Questions to consider in choosing a DMM; Importance of describing the dynamic range of a DMM in digits; Standard input resistance for DMM.

Provides information on test switching systems. Major subsystems of a test system; Types of general-purpose relays; Schematic diagram of a typical relay multiplexers; Relays used in constructing armature and reed matrices.

Explores the benefits, implementation and possible problems of alternating electric current (AC) scan-based testing system. Structural testing approach; Categories of fault models for AC scan; Methods for coinciding the assertion and deassertion of the scan shift enable.

Discusses the application of automatic test equipment for mixed-signal system-on-a-chip multisite testing. Definition of the efficiency of multisite testing in relation to the time required to test one device in a single site; Solutions for multisite testing; Approach for the implementation of the test-system software and hardware; Availability of time domains.

Presents information on microwave test systems in the electronics industry. Equation for the voltage standing wave ratio; Sources that cause impedance mismatches; Use of multiplexers in the system.

Presents information on developing functional test systems in the electronic industry. Use of system components in a design; Attributes of a system-ready instrument; Instrumentation in a good system design.

Reports on the collaboration between engineers of automobile companies General Motors (GM), Ford Motor Co., and DaimlerChrysler to develop a single document that will reduce the test burden on suppliers. Reasons behind the actions of the automobile companies; Changes from Ford and GM that brought the electromagnetic compatibility (EMC) requirements of the two companies closer than before; Simplification of various EMC tests at Ford; Reduction of EMC standards at GM; Information on EMC test procedures and hardware.

Discusses various issues on testing loaded-board fixtures. Importance of loaded-board tests; Factors that prompted manufacturers to reconsider long-established test paradigms in test fixtures; Role of test fixtures in loaded-board testing; Comparison of past and current board fixtures; Overview of the test fixture market; Design for test considerations in test-fixture operations.

Discusses the application of advanced fault models in the semiconductor industry. Benefits of the single stuck-at fault model; Techniques that can be used to test transition faults; Design for test considerations in the automatic test pattern generation.

Discusses the rating of power amplifiers used for radio frequency immunity test system. Graph of the input and output power levels of an amplifier; Information on gain compression and output signal distortion; Amount of power used by amplifiers; Rate of power levels guaranteed by manufacturers for their amplifiers.

Discusses options of engineers for supporting legacy test systems. Use of test-software development tools in rewriting the legacy tests; Options for supporting legacy test code; Benefits of implementing a modular test-system architecture.

Provides noise reduction techniques in test-system switches. Steps in solving noise problems; Effectiveness of tree switching in reducing the stray of open-switch capacitance encountered in large systems that resulted from connecting the unused relays in parallel in the system; Reasons for grounding a circuit.

Discusses the benefits and costs of overstress testing. Stresses which can identify product weaknesses; Information on the highly accelerated life test (HALT) profile; Determinants of HALT success; Prediction of mean time between returns using HALT margin.

Focuses on the solution provided by PXI computer architecture for obsolete test systems. Development of the SigmaSeries TestStation; Buses supported by the TestStation's TestFrame; Challenge in migrating test programs and fixtures from the SigmaSeries to the PXI bus architecture. INSET: PXI Trigger Bus Supports SigmaSeries CT.BUS.

Discusses the role of design for testability (DFT) testers in reducing testing cost in 2003. Types of DFT techniques; Advantages of a single, scalable DFT platform; Difference between DFT testers and conventional automated test equipment.

Examines functional test systems for printed circuit boards (PCB) used in personal emergency response systems developed by systems integrator Bloomy Controls and Lifeline Systems. Features of the functional test system of Lifeline Systems; Information the telephone and communicator PCB test systems; Benefits of using a commercial off the shelf test executive to architect a software.