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The Benefits and Costs of Overstress Testing.

Authors :
Meadowsong, Nahun
Kyser, Edmond L.
Source :
EE: Evaluation Engineering. Oct2003, Vol. 42 Issue 10, p62-67. 5p. 4 Graphs.
Publication Year :
2003

Abstract

Discusses the benefits and costs of overstress testing. Stresses which can identify product weaknesses; Information on the highly accelerated life test (HALT) profile; Determinants of HALT success; Prediction of mean time between returns using HALT margin.

Details

Language :
English
ISSN :
01490370
Volume :
42
Issue :
10
Database :
Academic Search Index
Journal :
EE: Evaluation Engineering
Publication Type :
Periodical
Accession number :
10992309