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Applying Advanced Fault Models.
- Source :
-
EE: Evaluation Engineering . Mar2004, Vol. 43 Issue 3, p48-53. 5p. 1 Diagram, 1 Graph. - Publication Year :
- 2004
-
Abstract
- Discusses the application of advanced fault models in the semiconductor industry. Benefits of the single stuck-at fault model; Techniques that can be used to test transition faults; Design for test considerations in the automatic test pattern generation.
Details
- Language :
- English
- ISSN :
- 01490370
- Volume :
- 43
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- EE: Evaluation Engineering
- Publication Type :
- Periodical
- Accession number :
- 12428143