1. A review of the Z²-FET 1T-DRAM memory: operation mechanisms and key parameters
- Author
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Cristoloveanu, S., Lee, K.H., Parihar, M.S., El Dirani, H., Lacord, J., Martinie, S., Le Royer, C., Barbe, J.-Ch., Mescot, X., Fonteneau, P., Galy, Ph., Gamiz, F., Navarro, C., Cheng, B., Duan, M., Adamu-Lema, F., Asenov, A., Taur, Y., Xu, Y., Kim, Y-T., Wan, J., and Bawedin, M.
- Subjects
Hardware_MEMORYSTRUCTURES ,Hardware_INTEGRATEDCIRCUITS - Abstract
The band-modulation and sharp-switching mechanisms in Z²-FET device operated as a capacitorless 1T-DRAM memory are reviewed. The main parameters that govern the memory performance are discussed based on detailed experiments and simulations. This 1T-DRAM memory does not suffer from super-coupling effect and can be integrated in sub-10 nm thick SOI films. It offers low leakage current, high current margin, long retention, low operating voltage especially for programming, and high speed. The Z²-FET is suitable for embedded memory applications.
- Published
- 2018