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Z²-FET DC hysteresis: deep understanding and preliminary model

Authors :
Lacord, J.
Martinie, S.
Parihar, M.-S
Lee, K
Bawedin, M
Cristoloveanu, S
Taur, Y
Barbé, J.-Ch
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI)
Direction de Recherche Technologique (CEA) (DRT (CEA))
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC )
Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
University of California [San Diego] (UC San Diego)
University of California
European Project: 687931,H2020,H2020-ICT-2015,REMINDER(2016)
University of California (UC)
Source :
SISPAD 2017, SISPAD 2017, Sep 2017, Kamakura, Japan
Publication Year :
2017
Publisher :
HAL CCSD, 2017.

Abstract

International audience; Z²-FET, a partially gated diode, was explored for ESD application due to its sharp switching behavior [1,2]. 1T-DRAM application of Z²-FET has recently been evidenced [3,4] leading to an even stronger interest for this device. However, a deep explanation of physical phenomena involved in Z²-FET operation has not been proposed yet. In this paper, we provide a detailed description of the Z²-FET DC behavior based on TCAD simulations and propose corresponding analytical modeling.

Details

Language :
English
Database :
OpenAIRE
Journal :
SISPAD 2017, SISPAD 2017, Sep 2017, Kamakura, Japan
Accession number :
edsair.dedup.wf.001..7fe8abb8038eb92ad2a16979f806b6e8