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Your search keyword '"SCANNING electron microscopes"' showing total 67 results
Start Over Descriptor "SCANNING electron microscopes" Publication Type Reviews Database Academic Search Index
67 results on '"SCANNING electron microscopes"'

51. FEI Announces New Quanta 50 Series SEM.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Quanta 50 Series scanning electron microscope (SEM) from FEI Co.

Published
2009

53. Scanning electron microscope.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Nova NanoSEM 30 series scanning electron microscope for Nova Corp.

Published
2007

54. Quanta 3D SEM/FIB Dual Beam.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Quanta 3D FEG analytical DualBeam from FEI Co.

Published
2007

55. Magnetic Field Cancellation.

Subjects
*MAGNETIC instruments, *MAGNETIC fields, *SCANNING electron microscopes, *OPTICAL instruments
Abstract

The article evaluates the magnetic field cancellation system Mag-NetX from Technical Manufacturing Corp. and offers information on its features including its ability to compensate magnetic interference that diminishes the performance of scanning and transmission microscope.

Published
2006

56. NEW TECHNOLOGIES.

Subjects
*DRUG development, *SCANNING electron microscopes, *APPLICATION software, *EQUIPMENT & supplies
Abstract

The article provides information on drug discovery and development technologies including Berthold Technologies GmbH & Co. KG's second generation TriStar2multilabel microplate reader, JEOL USA Inc.'s NeoScope benchtop scanning electron microscope (SEM) and Quintiles' Allume market entry software.

Published
2012

57. Field-Emission Scanning Electron Microscope.

Subjects
*SCIENTIFIC apparatus & instruments, *SCANNING electron microscopes
Abstract

Reviews the DS-130F, a field-emission scanning electron microscope from International Scientific Instruments.

Published
1989

58. Wet-sample scanning electron microscope.

Subjects
*SCANNING electron microscopes, *ELECTRON microscopes, *NEW product development, *SCIENTIFIC apparatus & instruments
Abstract

Presents a product review of ISI's scanning electron microscope (SEM) that eliminates the need for many sample preparation steps such as fixing, dehydrating, critical point drying and coating. Operation of the Wet-SEM; Features of the instrument.

Published
1989

59. Scanning Electron Microscope.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Magellan extreme resolution scanning electron microscope (SEM) from FEI Co.

Published
2010

60. Thermal Field Emission Analytical SEM.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the JSM-7001F thermal field emission analytical scanning electron microscope from Japan Electron Optics Laboratory.

Published
2007

61. new products.

Subjects
*FURNACES, *AIR filters, *SCANNING electron microscopes, *GRAPHITIZATION, *EVALUATION
Abstract

The article evaluates ceramic industry products including the LHTG and HTK ranges of graphitization furnaces from manufacturer Carbolite Gero, the Vista360 air filter from manufacturer RoboVent and the JSM-IT300HR scanning electron microscope from manufacturer JEOL USA Inc.

Published
2017

62. new products.

Subjects
*CERAMIC industries, *EQUIPMENT & supplies, *SCANNING electron microscopes, *EVALUATION
Abstract

The article offers information on software equipment for ceramic industry which include the RheocalcT Software v1.2.19 update from Brookfield Engineering Laboratories, the Gemini scanning electron microscope from Zeiss, and the VersaMix multiagitator system from Ross.

Published
2015

63. SHAKING UP MICROSCOPY.

Author

DAVENPORT, MATT

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article offers brief information on the scanning tunneling electron microscope developed by the company Nion.

Published
2014
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64. DEVICE CAPTURES 3-D SEM IMAGES.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the microCT device for obtaining scanning electron microscope images from Micro Photonics.

Published
2008

65. PITTCON POTPOURRI: JEOL.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the NeoScope JCM-5000 scanning electron microscope from JEOL USA Inc.

Published
2008

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