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Methodology for vetting heavily doped semiconductors for intermediate band photovoltaics: A case study in sulfur-hyperdoped silicon
- Source :
- Other univ. web domain
- Publication Year :
- 2015
-
Abstract
- We present a methodology for estimating the efficiency potential for candidate impurity-band photovoltaic materials from empirical measurements. This methodology employs both Fourier transform infrared spectroscopy and low-temperature photoconductivity to calculate a “performance figure of merit” and to determine both the position and bandwidth of the impurity band. We evaluate a candidate impurity-band material, silicon hyperdoped with sulfur; we find that the figure of merit is more than one order of magnitude too low for photovoltaic devices that exceed the thermodynamic efficiency limit for single band gap materials.<br />National Science Foundation (U.S.) (Energy, Power, and Adaptive Systems Grant Contract ECCS-1102050)<br />National Science Foundation (U.S.) (United States. Dept. of Energy NSF CA EEC-1041895)<br />Center for Clean Water and Clean Energy at MIT and KFUPM
Details
- Database :
- OAIster
- Journal :
- Other univ. web domain
- Notes :
- application/pdf, en_US
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1141881400
- Document Type :
- Electronic Resource