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TCAD development for lithography resolution enhancement

Authors :
Liebmann, L. W.
Mansfield, S. M.
Wong, A. K.
Lavin, M. A.
Leipold, W. C.
Dunham, T. G.
Source :
IBM Journal of Research and Development. Sept, 2001, Vol. 45 Issue 5, p651
Publication Year :
2001

Abstract

Advances in lithography have contributed significantly to the advancement of the integrated circuit technology. While non-optical next-generation lithography (NGL) solutions are being developed, optical lithography continues to be the workhorse for high-throughput very-large-scale integrated (VLSI) lithography. Extending optical lithography to the resolution levels necessary to support today's aggressive product road maps increasingly requires the use of resolution-enhancement techniques. This paper presents an overview of several resolution-enhancement techniques being developed and implemented in IBM for its leading-edge CMOS logic and memory products.

Details

ISSN :
00188646
Volume :
45
Issue :
5
Database :
Gale General OneFile
Journal :
IBM Journal of Research and Development
Publication Type :
Periodical
Accession number :
edsgcl.79547445