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Two types of test-anxious students: support for an information processing model

Authors :
Naveh-Benjamin, Moshe
McKeachie, Wilbert J.
Lin, Yi-Guang Li
Source :
Journal of Educational Psychology. June, 1987, Vol. 79, p131, 6 p.
Publication Year :
1987

Details

ISSN :
00220663
Volume :
79
Database :
Gale General OneFile
Journal :
Journal of Educational Psychology
Publication Type :
Academic Journal
Accession number :
edsgcl.5277859