Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy

A study of grazing incidence absorption and reflection spectra of NiO in the region of the Ni 2p edge is presented. The objective of the study is to evaluate the distortion of the near edge spectrum by the critical angle behavior of individual components within the spectrum. This can be useful in the improvement of the separation of multiplets and the enhancement of low spectral weight line shapes like charge transfer satellites. The measured spectra is compared with calculations utilizing an optical model.