Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy

MLA

Alders, D., et al. “Grazing Incidence Reflectivity and Total Electron Yield Effects in Soft X-Ray Absorption Spectroscopy.” Journal of Applied Physics, vol. 82, no. 6, Sept. 1997, p. 3120. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.20300765&authtype=sso&custid=ns315887.

APA

Alders, D., Hibma, T., Sawatzky, G. A., Cheung, K. C., van Dorssen, G. E., Roper, M. D., Padmore, H. A., van der Laan, G., Vogel, J., & Sacchi, M. (1997). Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy. Journal of Applied Physics, 82(6), 3120.

Chicago

Alders, D., T. Hibma, G.A. Sawatzky, K.C. Cheung, G.E. van Dorssen, M.D. Roper, H.A. Padmore, G. van der Laan, J. Vogel, and M. Sacchi. 1997. “Grazing Incidence Reflectivity and Total Electron Yield Effects in Soft X-Ray Absorption Spectroscopy.” Journal of Applied Physics 82 (6): 3120. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.20300765&authtype=sso&custid=ns315887.