Application of Kramers-Kronig analysis to the photoreflectance spectra of heavily doped GaAs/Si-GaAs structures

Kramers-Kronig analysis provides the means to study photoreflectance spectra of heavily doped GaAs/Si-GaAs structures. Using Kramers-Kronig analysis, a complex photoreflectance function is created. The function's modulus provides the critical point energy. The phase of the function is suitable for a topographical study of the homogenity of the structure'sinternal electric field.