Application of Kramers-Kronig analysis to the photoreflectance spectra of heavily doped GaAs/Si-GaAs structures

MLA

Jezierski, K., et al. “Application of Kramers-Kronig Analysis to the Photoreflectance Spectra of Heavily Doped GaAs/Si-GaAs Structures.” Journal of Applied Physics, vol. 77, no. 8, Apr. 1995, p. 4139. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.17635243&authtype=sso&custid=ns315887.

APA

Jezierski, K., Markiewicz, J., Misiewicz, J., Panek, M., Sciana, B., Korbutowicz, R., & Tlaczala, M. (1995). Application of Kramers-Kronig analysis to the photoreflectance spectra of heavily doped GaAs/Si-GaAs structures. Journal of Applied Physics, 77(8), 4139.

Chicago

Jezierski, K., J. Markiewicz, J. Misiewicz, M. Panek, B. Sciana, R. Korbutowicz, and M. Tlaczala. 1995. “Application of Kramers-Kronig Analysis to the Photoreflectance Spectra of Heavily Doped GaAs/Si-GaAs Structures.” Journal of Applied Physics 77 (8): 4139. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.17635243&authtype=sso&custid=ns315887.