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Low-Voltage Programmable Gate-All-Around (GAA) Nanosheet TFT Nonvolatile Memory Using Band-to-Band Tunneling Induced Hot Electron (BBHE) Method

Authors :
Lun-Chun Chen
Hung-Bin Chen
Yu-Shuo Chang
Shih-Han Lin
Ming-Hung Han
Jia-Jiun Wu
Mu-Shih Yeh
Yu-Ru Lin
Yung-Chun Wu
Source :
IEEE Journal of the Electron Devices Society, Vol 7, Pp 168-173 (2019)
Publication Year :
2019
Publisher :
IEEE, 2019.

Abstract

A low-voltage programmable gate-all-around (GAA) nanosheet poly-Si thin-film transistor (TFT) nonvolatile memory (NVM), which uses band-to-band tunneling induced hot electron (BBHE) programming, is demonstrated. The BBHE method is extremely efficient for programming data in the p-type GAA nanosheet TFT NVM because the GAA nanosheet structure enhances the source-to-drain component of the electric field in its channel. Therefore, the enhanced electric field of the BBHE phenomenon creates energetic electrons that surmount the tunneling oxide barrier easily and pass shallow traps in the charge trapping layer of the GAA TFT NVM. Consequently, the p-type GAA TFT NVM achieves low-voltage programming bias and satisfactory data retention

Details

Language :
English
ISSN :
21686734
Volume :
7
Database :
Directory of Open Access Journals
Journal :
IEEE Journal of the Electron Devices Society
Publication Type :
Academic Journal
Accession number :
edsdoj.3a16f88ca06c45609218901b2951549b
Document Type :
article
Full Text :
https://doi.org/10.1109/JEDS.2018.2886446