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Fourier transform-plasmon waveguide spectroscopy: a nondestructive multifrequency method for simultaneously determining polymer thickness and apparent index of refraction
Fourier transform-plasmon waveguide spectroscopy: a nondestructive multifrequency method for simultaneously determining polymer thickness and apparent index of refraction
- Source :
- Analytical chemistry. 86(24)
- Publication Year :
- 2014
-
Abstract
- Fourier transform (FT)-plasmon waveguide resonance (PWR) spectroscopy measures light reflectivity at a waveguide interface as the incident frequency and angle are scanned. Under conditions of total internal reflection, the reflected light intensity is attenuated when the incident frequency and angle satisfy conditions for exciting surface plasmon modes in the metal as well as guided modes within the waveguide. Expanding upon the concept of two-frequency surface plasmon resonance developed by Peterlinz and Georgiadis (Opt. Commun. 1996, 130, 260), the apparent index of refraction and the thickness of a waveguide can be measured precisely and simultaneously by FT-PWR with an average percent relative error of 0.4%. Measuring reflectivity for a range of frequencies extends the analysis to a wide variety of sample compositions and thicknesses since frequencies with the maximum attenuation can be selected to optimize the analysis. Additionally, the ability to measure reflectivity curves with both p- and s-polarized light provides anisotropic indices of refraction. FT-PWR is demonstrated using polystyrene waveguides of varying thickness, and the validity of FT-PWR measurements are verified by comparing the results to data from profilometry and atomic force microscopy (AFM).
- Subjects :
- Total internal reflection
Chemistry
business.industry
Polymers
Surface plasmon
Physics::Optics
Resonance
Refraction
Chemistry Techniques, Analytical
Analytical Chemistry
law.invention
symbols.namesake
Refractometry
Fourier transform
Optics
law
Spectroscopy, Fourier Transform Infrared
symbols
Polystyrenes
Surface plasmon resonance
business
Refractive index
Waveguide
Subjects
Details
- ISSN :
- 15206882
- Volume :
- 86
- Issue :
- 24
- Database :
- OpenAIRE
- Journal :
- Analytical chemistry
- Accession number :
- edsair.doi.dedup.....6267373dc23ca5ea2686ca615f87f08e