Fourier transform-plasmon waveguide spectroscopy: a nondestructive multifrequency method for simultaneously determining polymer thickness and apparent index of refraction

MLA

Jonathan M. Bobbitt, et al. “Fourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Multifrequency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction.” Analytical Chemistry, vol. 86, no. 24, Nov. 2014. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....6267373dc23ca5ea2686ca615f87f08e&authtype=sso&custid=ns315887.

APA

Jonathan M. Bobbitt, Stephen C. Weibel, Emily A. Smith, Moneium Elshobaki, & Sumit Chaudhary. (2014). Fourier transform-plasmon waveguide spectroscopy: a nondestructive multifrequency method for simultaneously determining polymer thickness and apparent index of refraction. Analytical Chemistry, 86(24).

Chicago

Jonathan M. Bobbitt, Stephen C. Weibel, Emily A. Smith, Moneium Elshobaki, and Sumit Chaudhary. 2014. “Fourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Multifrequency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction.” Analytical Chemistry 86 (24). http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....6267373dc23ca5ea2686ca615f87f08e&authtype=sso&custid=ns315887.