Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges

Authors :: Tanja, Etzelstorfer
Süess, M. a. r. t. i. n. . J.
Schiefler, G. u. s. t. a. v. . L.
Jacques, Vincent L. . R.
Dina, Carbone
Chrastina, Daniel
Isella, Giovanni
Ralph, Spolenak
Julian, Stangl
Hans, Sigg
Ana, Diaz
Johannes Kepler Univ Linz, Inst Semicond & Solid State Phys, A-4040 Linz, Austria
Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology [Zürich] (ETH Zürich)
Laboratory for Nanometallurgy [ETH Zürich]
Department of Materials [ETH Zürich] (D-MATL)
Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology [Zürich] (ETH Zürich)- Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology [Zürich] (ETH Zürich)
Paul Scherrer Inst, CH-5232 Villigen, Switzerland
European Synchrotron Radiation Facility (ESRF)
Politecn Milan, L NESS, Dipartimento Fis, I-22100 Como, Italy
Source :: Journal of Synchrotron Radiation, Journal of Synchrotron Radiation, International Union of Crystallography, 2014, 21, pp.111-118. ⟨10.1107/S1600577513025459⟩, Journal of Synchrotron Radiation, 21 (1), 'Journal of Synchrotron Radiation ', vol: 21, pages: 111-118 (2014), Journal of synchrotron radiation
Publication Year :: 2014
Publisher :: HAL CCSD, 2014.
Abstract: Journal of Synchrotron Radiation, 21 (1)<br />ISSN:0909-0495<br />ISSN:1600-5775

Subjects :: [PHYS]Physics [physics]
local probe X-ray diffraction
strain
Research Papers
X-ray diffraction

Language :: English
ISSN :: 09090495 and 16005775
Database :: OpenAIRE
Journal :: Journal of Synchrotron Radiation, Journal of Synchrotron Radiation, International Union of Crystallography, 2014, 21, pp.111-118. ⟨10.1107/S1600577513025459⟩, Journal of Synchrotron Radiation, 21 (1), 'Journal of Synchrotron Radiation ', vol: 21, pages: 111-118 (2014), Journal of synchrotron radiation
Accession number :: edsair.doi.dedup.....5ee494fe326dfccbace2106c0b69314b

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