Cite
Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges
MLA
Tanja, Etzelstorfer, et al. Scanning X-Ray Strain Microscopy of Inhomogeneously Strained Ge Micro-Bridges. Jan. 2014. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....5ee494fe326dfccbace2106c0b69314b&authtype=sso&custid=ns315887.
APA
Tanja, E., Süess, M. a. r. t. i. n. . J., Schiefler, G. u. s. t. a. v. . L., Jacques, V. L. . R., Dina, C., Chrastina, D., Isella, G., Ralph, S., Julian, S., Hans, S., & Ana, D. (2014). Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges.
Chicago
Tanja, Etzelstorfer, M. a. r. t. i. n. . J. Süess, G. u. s. t. a. v. . L. Schiefler, Vincent L. . R. Jacques, Carbone Dina, Daniel Chrastina, Giovanni Isella, et al. 2014. “Scanning X-Ray Strain Microscopy of Inhomogeneously Strained Ge Micro-Bridges,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....5ee494fe326dfccbace2106c0b69314b&authtype=sso&custid=ns315887.