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Fine structures in refractive index of sapphire at the LII,III absorption edge of aluminum determined by soft x-ray resonant reflectivity

Authors :
A. Bose
Mohammed H. Modi
Sanjay Rai
S. K. Deb
G. S. Lodha
R. K. Gupta
Arijeet Das
C. Mukherjee
S.C. Joshi
Tapas Ganguli
Source :
Applied Optics. 51:7402
Publication Year :
2012
Publisher :
The Optical Society, 2012.

Abstract

The optical constants of sapphire crystal (α-Al(2)O(3)) and amorphous Al(2)O(3) in the soft x-ray region (67-85 eV) around the aluminum LsubII,III/subabsorption edge (73.1 eV) are determined by angle-dependent x-ray reflectivity. The differences between the optical constant values of both the samples are discussed. The fine structures obtained in the absorption of crystalline sapphire are explained. An absorption feature at 70.2 eV is observed for the first time for crystalline alumina. Both datasets are compared to the tabulated values of Henke et al. [At. Data Nucl. Data Tables 54, 181 (1993)], Weaver et al. [Physik Daten, Physics Data: Optical Properties of Metals (Fach-information zentrum, 1981), Vols. 18-1 and 18-2], and [Handbook of Optical Constants of Solids II (Academic, 1991)].

Details

ISSN :
21553165 and 1559128X
Volume :
51
Database :
OpenAIRE
Journal :
Applied Optics
Accession number :
edsair.doi.dedup.....5a553ed12f9a4de2faae8181eef1a9ef
Full Text :
https://doi.org/10.1364/ao.51.007402