Back to Search
Start Over
Fine structures in refractive index of sapphire at the LII,III absorption edge of aluminum determined by soft x-ray resonant reflectivity
- Source :
- Applied Optics. 51:7402
- Publication Year :
- 2012
- Publisher :
- The Optical Society, 2012.
-
Abstract
- The optical constants of sapphire crystal (α-Al(2)O(3)) and amorphous Al(2)O(3) in the soft x-ray region (67-85 eV) around the aluminum LsubII,III/subabsorption edge (73.1 eV) are determined by angle-dependent x-ray reflectivity. The differences between the optical constant values of both the samples are discussed. The fine structures obtained in the absorption of crystalline sapphire are explained. An absorption feature at 70.2 eV is observed for the first time for crystalline alumina. Both datasets are compared to the tabulated values of Henke et al. [At. Data Nucl. Data Tables 54, 181 (1993)], Weaver et al. [Physik Daten, Physics Data: Optical Properties of Metals (Fach-information zentrum, 1981), Vols. 18-1 and 18-2], and [Handbook of Optical Constants of Solids II (Academic, 1991)].
- Subjects :
- Materials science
business.industry
chemistry.chemical_element
Atomic and Molecular Physics, and Optics
Amorphous solid
Crystal
Optics
chemistry
Absorption edge
Aluminium
Sapphire
Electrical and Electronic Engineering
Thin film
business
Absorption (electromagnetic radiation)
Engineering (miscellaneous)
Refractive index
Subjects
Details
- ISSN :
- 21553165 and 1559128X
- Volume :
- 51
- Database :
- OpenAIRE
- Journal :
- Applied Optics
- Accession number :
- edsair.doi.dedup.....5a553ed12f9a4de2faae8181eef1a9ef
- Full Text :
- https://doi.org/10.1364/ao.51.007402