Fine structures in refractive index of sapphire at the LII,III absorption edge of aluminum determined by soft x-ray resonant reflectivity

MLA

A. Bose, et al. “Fine Structures in Refractive Index of Sapphire at the LII,III Absorption Edge of Aluminum Determined by Soft x-Ray Resonant Reflectivity.” Applied Optics, vol. 51, Oct. 2012, p. 7402. EBSCOhost, https://doi.org/10.1364/ao.51.007402.

APA

A. Bose, Mohammed H. Modi, Sanjay Rai, S. K. Deb, G. S. Lodha, R. K. Gupta, Arijeet Das, C. Mukherjee, S.C. Joshi, & Tapas Ganguli. (2012). Fine structures in refractive index of sapphire at the LII,III absorption edge of aluminum determined by soft x-ray resonant reflectivity. Applied Optics, 51, 7402. https://doi.org/10.1364/ao.51.007402

Chicago

A. Bose, Mohammed H. Modi, Sanjay Rai, S. K. Deb, G. S. Lodha, R. K. Gupta, Arijeet Das, C. Mukherjee, S.C. Joshi, and Tapas Ganguli. 2012. “Fine Structures in Refractive Index of Sapphire at the LII,III Absorption Edge of Aluminum Determined by Soft x-Ray Resonant Reflectivity.” Applied Optics 51 (October): 7402. doi:10.1364/ao.51.007402.