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Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM

Authors :
Peter Denninger
Peter Schweizer
Stefanie Rechberger
Erdmann Spiecker
Christian Dolle
Source :
Microscopy and Microanalysis. 25:450-451
Publication Year :
2019
Publisher :
Oxford University Press (OUP), 2019.

Details

ISSN :
14358115 and 14319276
Volume :
25
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........e5e8707f5aab96a59b95466e52538714
Full Text :
https://doi.org/10.1017/s1431927619002988