Cite
Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM
MLA
Peter Denninger, et al. “Low Energy Nano Diffraction (LEND) – Bringing True Diffraction to SEM.” Microscopy and Microanalysis, vol. 25, Aug. 2019, pp. 450–51. EBSCOhost, https://doi.org/10.1017/s1431927619002988.
APA
Peter Denninger, Peter Schweizer, Stefanie Rechberger, Erdmann Spiecker, & Christian Dolle. (2019). Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM. Microscopy and Microanalysis, 25, 450–451. https://doi.org/10.1017/s1431927619002988
Chicago
Peter Denninger, Peter Schweizer, Stefanie Rechberger, Erdmann Spiecker, and Christian Dolle. 2019. “Low Energy Nano Diffraction (LEND) – Bringing True Diffraction to SEM.” Microscopy and Microanalysis 25 (August): 450–51. doi:10.1017/s1431927619002988.