Benchmarking β‐Ga 2 O 3 Schottky Diodes by Nanoscale Ballistic Electron Emission Microscopy

Authors :: Yuan Qin
Shibing Long
Wenxiang Mu
Guangwei Xu
Renato Buzio
Zhitai Jia
Qiming He
Xutang Tao
Andrea Gerbi
Source :: Advanced Electronic Materials. 6:1901151
Publication Year :: 2020
Publisher :: Wiley, 2020.

Subjects :: Materials science
Oxide semiconductor
Gallium oxide
business.industry
Optoelectronics
Schottky diode
business
Nanoscopic scale
Ballistic electron emission microscopy
Electronic, Optical and Magnetic Materials

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