A study on the Properties of Cu/SiOC(-H)/p-Si(100) and Cu/TaN/SiOC(-H)/p-Si(100) Interface

Authors :: Chang Young Kim
Jong-Kwan Woo
Heang Seuk Lee
Younghun Yu
Chi Kyu Choi
R. Navamathavan
Source :: Journal of the Korean Physical Society. 55:1960-1964
Publication Year :: 2009
Publisher :: Korean Physical Society, 2009.

Subjects :: Materials science
Interface (Java)
Fixed charge
Analytical chemistry
General Physics and Astronomy

Tools