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High-Sensitivity and High-Resolution RI Sensor With Ultrawide Measurement Range Based on NCF With Large Offset Splicing and MPF Interrogation

Authors :
Yongfu Zhang
Ailing Zhang
Junfeng Wang
Honggang Pan
Fei Liu
Pengxiang Chang
Rui Lin
Minghe Wang
Source :
IEEE Sensors Journal. 22:22707-22713
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
23799153 and 1530437X
Volume :
22
Database :
OpenAIRE
Journal :
IEEE Sensors Journal
Accession number :
edsair.doi...........9d001375b0d3244a02186eb76f6de824
Full Text :
https://doi.org/10.1109/jsen.2022.3218572