High-Sensitivity and High-Resolution RI Sensor With Ultrawide Measurement Range Based on NCF With Large Offset Splicing and MPF Interrogation

MLA

Yongfu Zhang, et al. “High-Sensitivity and High-Resolution RI Sensor With Ultrawide Measurement Range Based on NCF With Large Offset Splicing and MPF Interrogation.” IEEE Sensors Journal, vol. 22, Dec. 2022, pp. 22707–13. EBSCOhost, https://doi.org/10.1109/jsen.2022.3218572.

APA

Yongfu Zhang, Ailing Zhang, Junfeng Wang, Honggang Pan, Fei Liu, Pengxiang Chang, Rui Lin, & Minghe Wang. (2022). High-Sensitivity and High-Resolution RI Sensor With Ultrawide Measurement Range Based on NCF With Large Offset Splicing and MPF Interrogation. IEEE Sensors Journal, 22, 22707–22713. https://doi.org/10.1109/jsen.2022.3218572

Chicago

Yongfu Zhang, Ailing Zhang, Junfeng Wang, Honggang Pan, Fei Liu, Pengxiang Chang, Rui Lin, and Minghe Wang. 2022. “High-Sensitivity and High-Resolution RI Sensor With Ultrawide Measurement Range Based on NCF With Large Offset Splicing and MPF Interrogation.” IEEE Sensors Journal 22 (December): 22707–13. doi:10.1109/jsen.2022.3218572.