Automated orientation analysis of back-reflection X-ray Laue patterns. A system for indexing Laue spots and outputting stereographic projections by microcomputer

A new automatic system to analyze the orientations of the crystallographic axes of arbitrarily oriented cubic crystals using the back-reflection X-ray Laue method has been developed. The system consists of a tablet digitizer to input the coordinates of Laue spots, an usual microcomputer to index Laue patterns and a plotter to output stereographic projection.The accuracy of the analysis was remarkably improved in comparison with the traditional method of indexing with Greninger chart and Wulff net; it is estimated to be less than 0.1-0.2° in consequence of optimizing the rotation of standard projection and compensating the distance between specimen and film by computation. The time required is about ten minutes.